Inventor · disambiguated record
Seang P. Malathong
Also filed as: MALATHONG SEANG P
12 granted patents·1 pending application·166 citations·filing 2002–2025
92Inventor score
Technology areasG01R
Top patents by PatentIndex Score
13 records- 0198US11977098B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2023·Granted May 7, 2024·5 cites·22 claims
- 0298US11592465B2Pressure relief valveAEHR TEST SYSTEMS·Filed 2021·Granted Feb 28, 2023·13 cites·11 claims
- 0398US11112429B2Pressure relief valveAEHR TEST SYSTEMS·Filed 2019·Granted Sep 7, 2021·18 cites·8 claims
- 0498US10401385B2Limiting translation for consistent substrate-to-substrate contactAEHR TEST SYSTEMS·Filed 2017·Granted Sep 3, 2019·20 cites·20 claims
- 0598US9625521B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2014·Granted Apr 18, 2017·23 cites·5 claims
- 0697US9880197B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2017·Granted Jan 30, 2018·21 cites·10 claims
- 0797US8030957B2System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2009·Granted Oct 4, 2011·42 cites·14 claims
- 0896US8947116B2System for testing an integrated circuit of a device and its method of useLINDSEY SCOTT E·Filed 2011·Granted Feb 3, 2015·22 cites·12 claims
- 0989US12298328B2Controlling alignment during a thermal cycleAEHR TEST SYSTEMS·Filed 2024·Granted May 13, 2025·0 cites·16 claims
- 1084US2025224423A1System for testing an integrated circuit of a device and its method of useAEHR TEST SYSTEMS·Filed 2025·Application pending·0 cites
- 1152US7126363B2Die carrierAEHR TEST SYSTEMS·Filed 2005·Granted Oct 24, 2006·2 cites·14 claims
- 1233US7303929B2Reloading of die carriers without removal of die carriers from sockets on test boardsAEHR TEST SYSTEMS·Filed 2004·Granted Dec 4, 2007·0 cites·7 claims
- 1332US6859057B2Die carrierAEHR TEST SYSTEMS·Filed 2002·Granted Feb 22, 2005·0 cites·14 claims
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