Inventor · disambiguated record
Masatoshi Kanamaru
Also filed as: KANAMARU MASATOSHI
37 granted patents·12 pending applications·662 citations·filing 1985–2023
98Inventor score
Files withHITACHI LTD25HITACHI HIGH TECH CORP7RENESAS TECH CORP7HITACHI AUTOMOTIVE SYSTEMS LTD3NANIWA IRIZO2
Top patents by PatentIndex Score
49 records- 0196US5276573ASlider unit controllably actuated at a surface of a moving information recording mediumHITACHI LTD·Filed 1991·Granted Jan 4, 1994·99 cites·21 claims
- 0291US6444172B2Water quality meter and water quality monitoring systemHITACHI LTD·Filed 2001·Granted Sep 3, 2002·40 cites·6 claims
- 0389US6507204B1Semiconductor testing equipment with probe formed on a cantilever of a substrateHITACHI LTD·Filed 2000·Granted Jan 14, 2003·40 cites·14 claims
- 0489US4732369AArc apparatus for producing ultrafine particlesHITACHI LTD·Filed 1986·Granted Mar 22, 1988·49 cites·14 claims
- 0587US6398930B2Water quality meter and water quality monitoring systemHITACHI LTD·Filed 2001·Granted Jun 4, 2002·28 cites·2 claims
- 0686US6358762B1Manufacture method for semiconductor inspection apparatusHITACHI LTD·Filed 2000·Granted Mar 19, 2002·38 cites·16 claims
- 0786US4610718AMethod for manufacturing ultra-fine particlesHITACHI LTD·Filed 1985·Granted Sep 9, 1986·49 cites·6 claims
- 0885US6290908B1Water quality meter and water monitoring systemHITACHI LTD·Filed 1999·Granted Sep 18, 2001·47 cites·24 claims
- 0984US7795597B2Deflector array, exposure apparatus, and device manufacturing methodCANON KK·Filed 2007·Granted Sep 14, 2010·6 cites·9 claims
- 1081US5163209AMethod of manufacturing a stack-type piezoelectric elementHITACHI LTD·Filed 1990·Granted Nov 17, 1992·37 cites·7 claims
- 1180US7457206B2Optical head, optical information storage apparatus, and their fabrication methodHITACHI LTD·Filed 2005·Granted Nov 25, 2008·3 cites·10 claims
- 1278US6496023B1Semiconductor-device inspecting apparatus and a method for manufacturing the sameHITACHI LTD·Filed 2000·Granted Dec 17, 2002·20 cites·12 claims
- 1377US8143588B2Deflector array, exposure apparatus, and device manufacturing methodNAGAE KENICHI·Filed 2010·Granted Mar 27, 2012·3 cites·5 claims
- 1477US6531327B2Method for manufacturing semiconductor device utilizing semiconductor testing equipmentHITACHI LTD·Filed 2002·Granted Mar 11, 2003·17 cites·21 claims
- 1575US6774654B2Semiconductor-device inspecting apparatus and a method for manufacturing the sameRENESAS TECH CORP·Filed 2002·Granted Aug 10, 2004·16 cites·14 claims
- 1670US6828810B2Semiconductor device testing apparatus and method for manufacturing the sameRENESAS TECH CORP·Filed 2002·Granted Dec 7, 2004·14 cites·13 claims
- 1769US7505646B2Optical switch and optical switch arrayHITACHI METALS LTD·Filed 2006·Granted Mar 17, 2009·5 cites·14 claims
- 1868US6864568B2Packaging device for holding a plurality of semiconductor devices to be inspectedRENESAS TECH CORP·Filed 2002·Granted Mar 8, 2005·10 cites·16 claims
- 1963US5032248AGas sensor for measuring air-fuel ratio and method of manufacturing the gas sensorHITACHI LTD·Filed 1989·Granted Jul 16, 1991·21 cites·29 claims
- 2062US6548315B2Manufacture method for semiconductor inspection apparatusHITACHI LTD·Filed 2002·Granted Apr 15, 2003·8 cites·7 claims
- 2161US6714030B2Semiconductor inspection apparatusHITACHI LTD·Filed 2003·Granted Mar 30, 2004·7 cites·5 claims
- 2260US6573112B2Semiconductor device manufacturing methodHITACHI LTD·Filed 2002·Granted Jun 3, 2003·6 cites·10 claims
- 2359US6566149B1Method for manufacturing substrate for inspecting semiconductor deviceHITACHI LTD·Filed 1998·Granted May 20, 2003·22 cites·14 claims
- 2459US2024230441A9Pressure Sensor Module and Dispensing DeviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 2558US4915814ASensor for measurement of air/fuel ratio and method of manufacturingHITACHI LTD·Filed 1988·Granted Apr 10, 1990·19 cites·24 claims
- 2658US2025283770A1Pressure sensorHITACHI HIGH TECH CORP·Filed 2023·Application pending·0 cites
- 2758US2007171557A1Optical head, optical information storage apparatus, and their fabrication methodSHIMANO TAKESHI·Filed 2007·Application pending·0 cites
- 2857US6955870B2Method of manufacturing a semiconductor deviceHITACHI LTD·Filed 2002·Granted Oct 18, 2005·6 cites·9 claims
- 2957US6952110B2Testing apparatus for carrying out inspection of a semiconductor deviceRENESAS TECH CORP·Filed 2004·Granted Oct 4, 2005·6 cites·4 claims
- 3057US2025237565A1Pressure sensor and dispensing deviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 3157US2024408560A1Pressure sensor module and dispensing device including pressure sensor moduleHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 3256US6864695B2Semiconductor device testing apparatus and semiconductor device manufacturing method using itRENESAS TECH CORP·Filed 2001·Granted Mar 8, 2005·5 cites·7 claims
- 3355US6465264B1Method for producing semiconductor device and apparatus usable thereinHITACHI LTD·Filed 2000·Granted Oct 15, 2002·4 cites·15 claims
- 3455US2024353278A1Pressure SensorHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 3554US7018857B2Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probeRENESAS TECH CORP·Filed 2003·Granted Mar 28, 2006·6 cites·17 claims
- 3654US6660541B2Semiconductor device and a manufacturing method thereofHITACHI LTD·Filed 2002·Granted Dec 9, 2003·6 cites·12 claims
- 3754US6511857B1Process for manufacturing semiconductor deviceHITACHI LTD·Filed 1999·Granted Jan 28, 2003·15 cites·18 claims
- 3852US2024231064A9Optical filtering device, method of controlling optical filtering device, and mems shutterHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 3951US2025291170A1Optical filtering device and mems shutterHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 4050US9651408B2Structure of physical sensorHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2013·Granted May 16, 2017·0 cites·15 claims
- 4149US2007102842A1Process of microlens moldNANIWA IRIZO·Filed 2006·Application pending·0 cites
- 4245US6479305B2Semiconductor device manufacturing methodHITACHI LTD·Filed 1999·Granted Nov 12, 2002·10 cites·13 claims
- 4343US9890037B2Physical quantity sensorHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2015·Granted Feb 13, 2018·0 cites·6 claims
- 4441US2013009488A1Non-contact power transmission device and near-field antenna for sameHITACHI LTD·Filed 2010·Application pending·0 cites
- 4540US2007194472A1Process of fabricating microlens moldNANIWA IRIZO·Filed 2007·Application pending·0 cites
- 4640US2008043481A1Vehicle Headlight and Vehicle Operation Support ApparatusHITACHI LTD·Filed 2004·Application pending·0 cites
- 4739US10989731B2Physical quantity sensorHITACHI AUTOMOTIVE SYSTEMS LTD·Filed 2016·Granted Apr 27, 2021·0 cites·11 claims
- 4839US7119362B2Method of manufacturing semiconductor apparatusRENESAS TECH CORP·Filed 2002·Granted Oct 10, 2006·0 cites·11 claims
- 4932US9249011B2Process for fabricating MEMS deviceKANAMARU MASATOSHI·Filed 2012·Granted Feb 2, 2016·0 cites·8 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →