Inventor · disambiguated record
Setsuo Norioka
Also filed as: NORIOKA SETSUO
12 granted patents·149 citations·filing 1981–2003
92Inventor score
Top patents by PatentIndex Score
12 records- 0178US4990778AScanning electron microscopeJEOL LTD·Filed 1989·Granted Feb 5, 1991·23 cites·4 claims
- 0276US6831278B2System and method for electron beam irradiationSONY CORP·Filed 2002·Granted Dec 14, 2004·12 cites·6 claims
- 0376US6737660B2Electron beam irradiation apparatus and electron beam irradiating methodSONY CORP·Filed 2003·Granted May 18, 2004·13 cites·11 claims
- 0470US6953939B2Testing apparatus using scanning electron microscopeSONY CORP·Filed 2003·Granted Oct 11, 2005·9 cites·3 claims
- 0568US6734437B2System and method for electron beam irradiationJEOL LTD·Filed 2003·Granted May 11, 2004·8 cites·13 claims
- 0666US4547669AElectron beam scanning deviceJEOL LTD·Filed 1983·Granted Oct 15, 1985·12 cites·7 claims
- 0765US5801382AMethod of analyzing foreign materialsJEOL LTD·Filed 1997·Granted Sep 1, 1998·20 cites·10 claims
- 0864US5185530AElectron beam instrumentJEOL LTD·Filed 1991·Granted Feb 9, 1993·17 cites·5 claims
- 0964US4393309AMethod and apparatus for controlling the objective lens in a scanning electron microscope or the likeJEOL LTD·Filed 1981·Granted Jul 12, 1983·11 cites·2 claims
- 1062US6904164B2Method of inspecting accuracy in stitching pattern elementsJEOL LTD·Filed 2001·Granted Jun 7, 2005·12 cites·12 claims
- 1150US4417145AApparatus for controlling magnetic field intensityJEOL LTD·Filed 1981·Granted Nov 22, 1983·6 cites·4 claims
- 1248US4439681ACharged particle beam scanning deviceJEOL LTD·Filed 1981·Granted Mar 27, 1984·6 cites·5 claims
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