Inventor · disambiguated record
Franz Dietz
Also filed as: DIETZ FRANZ
17 granted patents·8 pending applications·188 citations·filing 2002–2024
92Inventor score
Files withATMEL GERMANY GMBH12BOSCH GMBH ROBERT5TELEFUNKEN SEMICONDUCTORS GMBH & CO KG3ATMEL CORP2DIETZ FRANZ2
Top patents by PatentIndex Score
25 records- 0197US7001804B2Method of producing active semiconductor layers of different thicknesses in an SOI waferATMEL GERMANY GMBH·Filed 2005·Granted Feb 21, 2006·100 cites·21 claims
- 0278US6878603B2Process for manufacturing a DMOS transistorATMEL GERMANY GMBH·Filed 2002·Granted Apr 12, 2005·24 cites·51 claims
- 0372US7973333B2Lateral DMOS transistor and method for the production thereofTELEFUNKEN SEMICONDUCTORS GMBH & CO KG·Filed 2007·Granted Jul 5, 2011·6 cites·11 claims
- 0470US6933215B2Process for doping a semiconductor bodyATMEL GERMANY GMBH·Filed 2002·Granted Aug 23, 2005·14 cites·33 claims
- 0570US6806131B2Process for manufacturing a DMOS transistorATMEL GERMANY GMBH·Filed 2002·Granted Oct 19, 2004·15 cites·48 claims
- 0670US6780713B2Process for manufacturing a DMOS transistorATMEL GERMANY GMBH·Filed 2002·Granted Aug 24, 2004·14 cites·49 claims
- 0769US7521756B2DMOS transistor with optimized periphery structureATMEL GERMANY GMBH·Filed 2006·Granted Apr 21, 2009·4 cites·10 claims
- 0863US2025072086A1Microelectronic component and method for producing a microelectronic componentBOSCH GMBH ROBERT·Filed 2024·Application pending·0 cites
- 0956US7851326B2Method for producing deep trench structuresTELEFUNKEN SEMICONDUCTORS GMBH & CO KG·Filed 2007·Granted Dec 14, 2010·1 cites·13 claims
- 1056US7130175B2Monolithic integratable circuit arrangement for protection against a transient voltageATMEL GERMANY GMBH·Filed 2004·Granted Oct 31, 2006·8 cites·13 claims
- 1152US11175331B2Aging detector for an electrical circuit component, method for monitoring an aging of a circuit component, component and control deviceBOSCH GMBH ROBERT·Filed 2017·Granted Nov 16, 2021·0 cites·8 claims
- 1252US2007207589A1Registration mark within an overlap of dopant regionsATMEL CORP·Filed 2007·Application pending·0 cites
- 1351US7230342B2Registration mark within an overlap of dopant regionsATMEL CORP·Filed 2005·Granted Jun 12, 2007·0 cites·5 claims
- 1449US7144796B2Method of fabricating semiconductor components through implantation and diffusion in a semiconductor substrateATMEL GERMANY GMBH·Filed 2004·Granted Dec 5, 2006·2 cites·25 claims
- 1546US2009160009A1Semiconductor array and method for manufacturing a semiconductor arrayATMEL GERMANY GMBH·Filed 2006·Application pending·0 cites
- 1642US2009017305A1Manufacturing process for integrated microelectromechanical componentsDIETZ FRANZ·Filed 2008·Application pending·0 cites
- 1740US2007267683A1Nonvolatile memory cell of a circuit integrated in a semiconductor chip, method for producing the same, and application of a nonvolatile memory cellATMEL GERMANY GMBH·Filed 2007·Application pending·0 cites
- 1839US10684323B2Assembly of strip conductors, device, and method for determining errors in a semiconductor circuitBOSCH GMBH ROBERT·Filed 2016·Granted Jun 16, 2020·0 cites·6 claims
- 1939US10431507B2Contact-via chain as corrosion detectorBOSCH GMBH ROBERT·Filed 2016·Granted Oct 1, 2019·0 cites·4 claims
- 2038US7189619B2Process for manufacturing vertically insulated structural components on SOI material of various thicknessATMEL GERMANY GMBH·Filed 2005·Granted Mar 13, 2007·0 cites·9 claims
- 2137US2007290226A1Method for producing a semiconductor arrangement, semiconductor arrangement and its applicationBERNTGEN JUERGEN·Filed 2007·Application pending·0 cites
- 2236US7009256B2Semiconductor over-voltage protection structure for integrated circuit and for diodeATMEL GERMANY GMBH·Filed 2004·Granted Mar 7, 2006·0 cites·19 claims
- 2336US2011133286A1Integrierter schaltungsteilDIETZ FRANZ·Filed 2010·Application pending·0 cites
- 2435US7923362B2Method for manufacturing a metal-semiconductor contact in semiconductor componentsTELEFUNKEN SEMICONDUCTORS GMBH & CO KG·Filed 2006·Granted Apr 12, 2011·0 cites·14 claims
- 2531US2019271728A1Device and method for detecting a number of electrostatic dischargesBOSCH GMBH ROBERT·Filed 2017·Application pending·0 cites
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