Inventor · disambiguated record
Liang-Fu Fan
Also filed as: Fan liang-fu
11 granted patents·2 pending applications·11 citations·filing 2021–2024
84Inventor score
Top patents by PatentIndex Score
13 records- 0197US11094499B1Apparatus of charged-particle beam such as electron microscope comprising sliding specimen table within objective lensCHEN ZHONGWEI·Filed 2021·Granted Aug 17, 2021·5 cites·20 claims
- 0293US11257659B1Electrode assembly, electronic apparatus/device using the same, and apparatus of charged-particle beam such as electron microscope using the sameCHEN ZHONGWEI·Filed 2021·Granted Feb 22, 2022·2 cites·9 claims
- 0389US11664189B2Apparatus of charged-particle beam such as scanning electron microscope comprising plasma generator, and method thereofBORRIES PTE LTD·Filed 2022·Granted May 30, 2023·1 cites·20 claims
- 0489US11569059B2Apparatus of charged-particle beam such as electron microscope comprising plasma generator, and method thereofCHEN ZHONGWEI·Filed 2021·Granted Jan 31, 2023·1 cites·18 claims
- 0588US11664186B1Apparatus of electron beam comprising pinnacle limiting plate and method of reducing electron-electron interactionBORRIES PTE LTD·Filed 2022·Granted May 30, 2023·1 cites·20 claims
- 0684US11593938B2Rapid and automatic virus imaging and analysis system as well as methods thereofCHEN ZHONGWEI·Filed 2021·Granted Feb 28, 2023·1 cites·23 claims
- 0776US11355312B2Stage driving system and apparatus or device such as apparatus of charged-particle beam comprising the sameCHEN ZHONGWEI·Filed 2021·Granted Jun 7, 2022·0 cites·18 claims
- 0876US11328898B2Digital detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereofCHEN ZHONGWEI·Filed 2021·Granted May 10, 2022·0 cites·19 claims
- 0975US11295927B1Apparatus of charged-particle beam such as electron microscope comprising co-condensers for continuous image resolution tuningCHEN ZHONGWEI·Filed 2021·Granted Apr 5, 2022·0 cites·14 claims
- 1070US11854763B1Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereofBORRIES PTE LTD·Filed 2022·Granted Dec 26, 2023·0 cites·20 claims
- 1162US11854762B1MEMS sample holder, packaged product thereof, and apparatus of charged-particle beam such as electron microscope using the sameBORRIES PTE LTD·Filed 2023·Granted Dec 26, 2023·0 cites·18 claims
- 1261US2024362778A1Rapid and automatic virus imaging and analysis system as well as methods thereofBORRIES PTE LTD·Filed 2024·Application pending·0 cites
- 1355US2023170178A1Rapid and automatic virus imaging and analysis system as well as methods thereofBORRIES PTE LTD·Filed 2023·Application pending·0 cites
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