Inventor · disambiguated record
Changwook Jeong
Also filed as: JEONG CHANGWOOK
17 granted patents·12 pending applications·14 citations·filing 2012–2023
88Inventor score
Files withSAMSUNG ELECTRONICS CO LTD23PURDUE RESEARCH FOUNDATION4JEONG CHANGWOOK1KELLOGG BROWN & ROOT LLC1
Top patents by PatentIndex Score
29 records- 0188US11982980B2Simulation method for semiconductor fabrication process and method for manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted May 14, 2024·4 cites·18 claims
- 0287US11733603B2Proximity correction methods for semiconductor manufacturing processesSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Aug 22, 2023·2 cites·20 claims
- 0383US10468151B2High optical transparent two-dimensional electronic conducting system and process for generating samePURDUE RESEARCH FOUNDATION·Filed 2016·Granted Nov 5, 2019·2 cites·14 claims
- 0475US9524806B2Hybrid transparent conducting materialsJEONG CHANGWOOK·Filed 2012·Granted Dec 20, 2016·3 cites·16 claims
- 0573US11515057B2High optical transparent two-dimensional electronic conducting system and process for generating samePURDUE RESEARCH FOUNDATION·Filed 2020·Granted Nov 29, 2022·0 cites·20 claims
- 0668US11886783B2Simulation system for semiconductor process and simulation method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Jan 30, 2024·0 cites·17 claims
- 0765US11741596B2Semiconductor wafer fault analysis system and operation method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Aug 29, 2023·1 cites·18 claims
- 0864US2024086599A1System and method for modeling a semiconductor fabrication processSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 0963US10839974B2High optical transparent two-dimensional electronic conducting system and process for generating samePURDUE RESEARCH FOUNDATION·Filed 2019·Granted Nov 17, 2020·0 cites·20 claims
- 1062US10650910B2Semiconductor fault analysis device and fault analysis method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted May 12, 2020·2 cites·20 claims
- 1162US2014014171A1High optical transparent two-dimensional electronic conducting system and process for generating samePURDUE RESEARCH FOUNDATION·Filed 2013·Application pending·0 cites
- 1261US12400119B2Learning method and system for object tracking based on hybrid neural networkSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Aug 26, 2025·0 cites·16 claims
- 1360US2024207801A1Electrification of heat supply to fluidized regeneration systemKELLOGG BROWN & ROOT LLC·Filed 2022·Application pending·0 cites
- 1459US12236178B2Methods of generating circuit models and manufacturing integrated circuits using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 25, 2025·0 cites·16 claims
- 1558US11574095B2Simulation system for semiconductor process and simulation method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Feb 7, 2023·0 cites·17 claims
- 1655US11853660B2System and method for modeling a semiconductor fabrication processSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Dec 26, 2023·0 cites·14 claims
- 1752US12430880B2Method and system performing pattern clusteringSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Sep 30, 2025·0 cites·19 claims
- 1852US11775840B2Non-transitory computer-readable medium storing program code generating wafer map based on generative adversarial networks and computing device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Oct 3, 2023·0 cites·19 claims
- 1950US2022207393A1Method of predicting semiconductor material properties and method of testing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Application pending·0 cites
- 2048US11669773B2Electronic devices generating verification vector for verifying semiconductor circuit and methods of operating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jun 6, 2023·0 cites·20 claims
- 2148US2023229841A1Method and system for simulating and verifying layout based on distributionSAMSUNG ELECTRONICS CO LTD·Filed 2023·Application pending·0 cites
- 2248US2022374498A1Data processing method of detecting and recovering missing values, outliers and patterns in tensor stream dataSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 2345US12175177B2Method and apparatus with system verification based on reinforcement learningSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Dec 24, 2024·0 cites·18 claims
- 2444US2023169240A1Computing device and method generating optimal input dataSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 2544US2021174201A1Computing device, operating method of computing device, and storage mediumSAMSUNG ELECTRONICS CO LTD·Filed 2020·Application pending·0 cites
- 2644US2023136021A1Method and system for three-dimensional modelingSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 2742US2023025626A1Method and apparatus for generating process simulation modelsSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 2838US2022207431A1System and method for training student friendly teacher model and student modelSAMSUNG ELECTRONICS CO LTD·Filed 2021·Application pending·0 cites
- 2936US2021056425A1Method and system for hybrid model including machine learning model and rule-based modelSAMSUNG ELECTRONICS CO LTD·Filed 2020·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →