Inventor · disambiguated record
Frans De Nooij
Also filed as: DE NOOIJ FRANS
3 granted patents·17 citations·filing 2010–2015
65Inventor score
Top patents by PatentIndex Score
3 records- 0185US9568304B2Image sequence and evaluation method and system for structured illumination microscopyMITUTOYO CORP·Filed 2015·Granted Feb 14, 2017·8 cites·12 claims
- 0283US9182583B2Structured illumination microscopy optical arrangement including projection artifact supression elementMITUTOYO CORP·Filed 2013·Granted Nov 10, 2015·7 cites·20 claims
- 0360US8576410B2Method and apparatus for determining a height of a number of spatial positions on a sampleJANSEN MAARTEN JOZEF·Filed 2010·Granted Nov 5, 2013·2 cites·19 claims
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