Inventor · disambiguated record
Kuei-Pao Chen
Also filed as: CHEN KUEI-PAO
14 granted patents·2 pending applications·81 citations·filing 2005–2013
88Inventor score
Top patents by PatentIndex Score
16 records- 0195US8031930B2Testing system and testing method for inspecting electonic devicesYOUNGTEK ELECTRONICS CORP·Filed 2008·Granted Oct 4, 2011·64 cites·17 claims
- 0278US8519458B2Light-emitting element detection and classification deviceWANG BILY·Filed 2011·Granted Aug 27, 2013·4 cites·14 claims
- 0373US8710387B2LED package chip classification systemWANG BILY·Filed 2011·Granted Apr 29, 2014·3 cites·16 claims
- 0471US8686310B2Packaged chip detection and classification deviceWANG BILY·Filed 2011·Granted Apr 1, 2014·2 cites·11 claims
- 0564US8873920B2Light-guiding cover structureWANG BILY·Filed 2012·Granted Oct 28, 2014·2 cites·14 claims
- 0656US7329028B2Uniform light generating system for adjusting output brightness and method of using the sameYOUNGTEK ELECTRONICS CORP·Filed 2006·Granted Feb 12, 2008·2 cites·26 claims
- 0753US9029725B2Packaged chip detection and classification deviceYOUNGTEK ELECTRONICS CORP·Filed 2013·Granted May 12, 2015·0 cites·8 claims
- 0852US7379171B2Optical object distance simulation deviceYOUNGTEK ELECTRONICS CORP·Filed 2006·Granted May 27, 2008·2 cites·9 claims
- 0951US8107720B2Detection system for detecting appearances of many electronic elements and methods of using the sameWANG BILY·Filed 2009·Granted Jan 31, 2012·1 cites·18 claims
- 1050US7256603B1Apparatus for measuring the static parameters of integrated circuitsYOUNGTEK ELECTRONICS CORP·Filed 2006·Granted Aug 14, 2007·1 cites·10 claims
- 1147US2010166290A1Die defect inspecting system with a die defect inspecting function and a method of using the sameYOUNGTEK ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 1245US7898663B2Uniform light generating system for testing an image-sensing device and method of using the sameYOUNGTEK ELECTRONICS CORP·Filed 2008·Granted Mar 1, 2011·0 cites·20 claims
- 1345US7800841B2Optical object distance simulation device for reducing total optical pathYOUNGTEK ELECTRONICS CORP·Filed 2008·Granted Sep 21, 2010·0 cites·7 claims
- 1435US8525524B2Multi-track detection system for detecting the appearance of electronic elementsWANG BILY·Filed 2011·Granted Sep 3, 2013·0 cites·18 claims
- 1529US7163829B2Method of integration testing for packaged electronic componentsYOUNGTEK ELECTRONICS CORP·Filed 2005·Granted Jan 16, 2007·0 cites·10 claims
- 1627US2006226848A1Mass-production LED test device for mass productionYOUNGTEK ELECTRONICS CORP·Filed 2005·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →