Inventor · disambiguated record
Kazuyuki Tsunokuni
Also filed as: TSUNOKUNI KAZUYUKI
19 granted patents·10 pending applications·198 citations·filing 1995–2021
93Inventor score
Files withNIHON MICRONICS KK15HITACHI LTD7RENESAS ELECTRONICS CORP2RENESAS TECH CORP2FUNAKOSHI TAKAKO1
Top patents by PatentIndex Score
29 records- 0196US6771077B2Method of testing electronic devices indicating short-circuitHITACHI LTD·Filed 2002·Granted Aug 3, 2004·85 cites·11 claims
- 0291US7411301B2Semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2005·Granted Aug 12, 2008·16 cites·20 claims
- 0381US5661061AProcess for fabricating a semiconductor integrated circuit device having the multi-layered fin structureHITACHI LTD·Filed 1995·Granted Aug 26, 1997·48 cites·13 claims
- 0473US7023091B2Semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2003·Granted Apr 4, 2006·13 cites·11 claims
- 0572US6895346B2Method for test conditionsHITACHI LTD·Filed 2002·Granted May 17, 2005·10 cites·15 claims
- 0671US7977238B2Method of manufacturing a semiconductor integrated circuit deviceRENESAS ELECTRONICS CORP·Filed 2010·Granted Jul 12, 2011·2 cites·16 claims
- 0768US6780660B2System for testing electronic devicesHITACHI LTD·Filed 2002·Granted Aug 24, 2004·9 cites·10 claims
- 0867US6770496B2Method of testing electronic devicesHITACHI LTD·Filed 2002·Granted Aug 3, 2004·8 cites·12 claims
- 0966US7786585B2Semiconductor integrated circuit deviceRENESAS ELECTRONICS CORP·Filed 2008·Granted Aug 31, 2010·2 cites·32 claims
- 1063US2021091400A1Method for manufacturing secondary batteryNIHON MICRONICS KK·Filed 2020·Application pending·0 cites
- 1160US12170374B2Secondary batteryNIHON MICRONICS KK·Filed 2021·Granted Dec 17, 2024·0 cites·12 claims
- 1257US11245113B2Secondary batteryNIHON MICRONICS KK·Filed 2019·Granted Feb 8, 2022·0 cites·19 claims
- 1357US2019273278A1Method for manufacturing secondary batteryNIHON MICRONICS KK·Filed 2017·Application pending·0 cites
- 1452US10705151B2Intermediate structure unit for secondary cell and method for manufacturing secondary cellNIHON MICRONICS KK·Filed 2016·Granted Jul 7, 2020·0 cites·15 claims
- 1552US2017131361A1Testing device and testing method for sheet-shaped cellNIHON MICRONICS KK·Filed 2014·Application pending·0 cites
- 1651US9735594B2Charging/discharging deviceNIHON MICRONICS KK·Filed 2013·Granted Aug 15, 2017·0 cites·19 claims
- 1751US2022123358A1Secondary batteryNIHON MICRONICS KK·Filed 2020·Application pending·0 cites
- 1850US10090507B2Secondary battery-mounted circuit chip and manufacturing method thereofNIHON MICRONICS KK·Filed 2014·Granted Oct 2, 2018·0 cites·15 claims
- 1949US2020373575A1Secondary batteryNIHON MICRONICS KK·Filed 2020·Application pending·0 cites
- 2047US2020006764A1Secondary batteryNIHON MICRONICS KK·Filed 2019·Application pending·0 cites
- 2146US2020006763A1Electricity storage deviceNIHON MICRONICS KK·Filed 2019·Application pending·0 cites
- 2245US8093723B2Method of manufacturing a semiconductor integrated circuit deviceFUNAKOSHI TAKAKO·Filed 2011·Granted Jan 10, 2012·0 cites·8 claims
- 2341US2020006009A1Electricity storage device and method for manufacturing solid electrolyte layerNIHON MICRONICS KK·Filed 2019·Application pending·0 cites
- 2440US2021193924A1Power storage deviceNIHON MICRONICS KK·Filed 2018·Application pending·0 cites
- 2539US2004092044A1Ion current density measuring method and instrument, and semiconductor device manufacturing methodFiled 2003·Application pending·0 cites
- 2638US6841405B2Photomask for test wafersHITACHI LTD·Filed 2002·Granted Jan 11, 2005·0 cites·16 claims
- 2736US8612811B2Defective-ratio predicting method, defective-ratio predicting program, managing method for semiconductor manufacturing apparatus, and manufacturing method for semiconductor deviceMATSUMOTO CHIZU·Filed 2009·Granted Dec 17, 2013·0 cites·17 claims
- 2836US6656752B1Ion current density measuring method and instrument, and semiconductor device manufacturing methodHITACHI LTD·Filed 1999·Granted Dec 2, 2003·5 cites·5 claims
- 2931US10686210B2Secondary battery mounted chip manufacturing methodNIHON MICRONICS KK·Filed 2016·Granted Jun 16, 2020·0 cites·13 claims
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