Inventor · disambiguated record
Shigeki Iwanaga
Also filed as: IWANAGA SHIGEKI
18 granted patents·9 pending applications·19 citations·filing 2009–2022
88Inventor score
Top patents by PatentIndex Score
27 records- 0182US10604731B2Cell analyzer, cell analyzer controlling method, and programSYSMEX CORP·Filed 2017·Granted Mar 31, 2020·2 cites·22 claims
- 0281US11385448B2Microscope apparatusSYSMEX CORP·Filed 2019·Granted Jul 12, 2022·3 cites·13 claims
- 0375US10676784B2Sample analyzing method and sample analyzerSYSMEX CORP·Filed 2016·Granted Jun 9, 2020·1 cites·7 claims
- 0471USD827008SMicroscopeSYSMEX CORP·Filed 2017·Granted Aug 28, 2018·13 cites·1 claims
- 0567US12066433B2Method for analyzing test substance, analyzer, training method, analyzer system, and analysis programSYSMEX CORP·Filed 2022·Granted Aug 20, 2024·0 cites·20 claims
- 0667US11473130B2Sample analyzing method and sample analyzerSYSMEX CORP·Filed 2019·Granted Oct 18, 2022·0 cites·17 claims
- 0759US11598952B2Optical device, phase plate, and image forming methodSYSMEX CORP·Filed 2019·Granted Mar 7, 2023·0 cites·17 claims
- 0857US10904491B2Method of controlling microscope system, microscope system, and recording mediumSYSMEX CORP·Filed 2019·Granted Jan 26, 2021·0 cites·18 claims
- 0955US11112404B2Method for obtaining information of test substanceSYSMEX CORP·Filed 2018·Granted Sep 7, 2021·0 cites·20 claims
- 1055US10222612B2Optical device, phase plate, and image forming methodSYSMEX CORP·Filed 2017·Granted Mar 5, 2019·0 cites·15 claims
- 1152US2010108539A1Method for detecting analyte, detection apparatus, and test chipSYSMEX CORP·Filed 2009·Application pending·0 cites
- 1252US2010112578A1Test chip, detection apparatus, and method for detecting analyteSYSMEX CORP·Filed 2009·Application pending·0 cites
- 1350US10585275B2Microscope device, microscope system, and imaging methodSYSMEX CORP·Filed 2017·Granted Mar 10, 2020·0 cites·18 claims
- 1450US2014291166A1Method and kit for electrochemically detecting analyteSYSMEX CORP·Filed 2014·Application pending·0 cites
- 1548US12253526B2Fluorescent dye and use thereofEISAI R&D MAN CO LTD·Filed 2021·Granted Mar 18, 2025·0 cites·20 claims
- 1648US2020173980A1Method of determining quality of cell separation, particle detection method, and particle separation apparatusSYSMEX CORP·Filed 2019·Application pending·0 cites
- 1747US11366097B2Cell imaging method, cell imaging apparatus, particle imaging method, and particle imaging apparatusSYSMEX CORP·Filed 2018·Granted Jun 21, 2022·0 cites·15 claims
- 1846US2020264181A1Measurement success/failure determination method and sample measurement deviceSYSMEX CORP·Filed 2020·Application pending·0 cites
- 1945US11285077B2Blood collection device, blood collection set, blood collection methodSYSMEX CORP·Filed 2017·Granted Mar 29, 2022·0 cites·19 claims
- 2043US8920626B2Method of electrochemically detecting a sample substanceSUZUKI SEIGO·Filed 2011·Granted Dec 30, 2014·0 cites·14 claims
- 2142US10732095B2Particle imaging device and particle imaging methodSYSMEX CORP·Filed 2016·Granted Aug 4, 2020·0 cites·21 claims
- 2242US9157884B2Method for electrochemically detecting target substance, method for electrochemically detecting analyte, and detection setSEIKE MASAYOSHI·Filed 2011·Granted Oct 13, 2015·0 cites·14 claims
- 2342US2020264170A1Method for acquiring information on analyteSYSMEX CORP·Filed 2020·Application pending·0 cites
- 2441US2012267258A1Method for electrochemically detecting analyteURAOKA YUKIHARU·Filed 2012·Application pending·0 cites
- 2538US2019128793A1Cell detection method and cell detection systemSYSMEX CORP·Filed 2018·Application pending·0 cites
- 2636US9157885B2Method of electrochemically detecting target substance, method of electrochemically detecting analyte, test chip, and detection setIWANAGA SHIGEKI·Filed 2011·Granted Oct 13, 2015·0 cites·11 claims
- 2734US2012161268A1Photocurrent detection electrode, manufacturing method, and working electrode substrateIWANAGA SHIGEKI·Filed 2011·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →