Inventor · disambiguated record
Joong-Ki Jeong
Also filed as: JEONG JOONG-KI
24 granted patents·4 pending applications·50 citations·filing 2008–2024
94Inventor score
Top patents by PatentIndex Score
28 records- 0185US9091668B2Joint inspection apparatusKOH YOUNG TECH INC·Filed 2013·Granted Jul 28, 2015·8 cites·9 claims
- 0284US12135204B2Apparatus and method for determining three-dimensional shape of objectKOH YOUNG TECH INC·Filed 2020·Granted Nov 5, 2024·1 cites·14 claims
- 0384US8369603B2Method for inspecting measurement objectKOH YOUNG TECH INC·Filed 2010·Granted Feb 5, 2013·6 cites·11 claims
- 0484US2025027766A1Apparatus and method for determining three-dimensional shape of objectKOH YOUNG TECH INC·Filed 2024·Application pending·0 cites
- 0584US2025012565A1Apparatus and method for determining three-dimensional shape of objectKOH YOUNG TECH INC·Filed 2024·Application pending·0 cites
- 0683US9221128B2Method of inspecting a solder jointKOH YOUNG TECH INC·Filed 2013·Granted Dec 29, 2015·7 cites·6 claims
- 0783US8902418B2Board inspection methodKOH YOUNG TECH INC·Filed 2013·Granted Dec 2, 2014·4 cites·12 claims
- 0881US11244436B2Method for inspecting mounting state of component, printed circuit board inspection apparatus, and computer readable recording mediumKOH YOUNG TECH INC·Filed 2019·Granted Feb 8, 2022·4 cites·15 claims
- 0980US9739605B2Shape measurement apparatus and methodKOH YOUNG TECH INC·Filed 2016·Granted Aug 22, 2017·2 cites·17 claims
- 1080US9091725B2Board inspection apparatus and methodJEONG JOONG-KI·Filed 2010·Granted Jul 28, 2015·4 cites·8 claims
- 1174US9062966B2Method of inspecting a three dimensional shapeJEONG JOONG-KI·Filed 2011·Granted Jun 23, 2015·4 cites·15 claims
- 1272US8548224B2Method for inspecting measurement objectKOH YOUNG TECH INC·Filed 2012·Granted Oct 1, 2013·2 cites·10 claims
- 1370US12146734B2Apparatus and method for determining three-dimensional shape of objectKOH YOUNG TECH INC·Filed 2020·Granted Nov 19, 2024·0 cites·11 claims
- 1467US9243899B2Method of measuring a height of 3-dimensional shape measurement apparatusKOH YOUNG TECH INC·Filed 2013·Granted Jan 26, 2016·2 cites·12 claims
- 1565US8837809B2Method for detecting a bridge connecting failureJEONG JOONG-KI·Filed 2011·Granted Sep 16, 2014·2 cites·11 claims
- 1664US9125336B2Method of inspecting boardJEONG JOONG-KI·Filed 2011·Granted Sep 1, 2015·1 cites·9 claims
- 1764US8856721B2Method for generating task data of a PCB and inspecting a PCBKOH YOUNG TECH INC·Filed 2013·Granted Oct 7, 2014·1 cites·16 claims
- 1862US9275292B2Shape measurement apparatus and methodJEONG JOONG-KI·Filed 2010·Granted Mar 1, 2016·1 cites·18 claims
- 1960US9256912B2Method of measuring measurement targetJEONG JOONG-KI·Filed 2010·Granted Feb 9, 2016·1 cites·5 claims
- 2054US9791266B2Shape measurement apparatus and methodKOH YOUNG TECH INC·Filed 2013·Granted Oct 17, 2017·0 cites·6 claims
- 2154US8724883B2Method for inspecting measurement objectKOH YOUNG TECH INC·Filed 2013·Granted May 13, 2014·0 cites·7 claims
- 2251US10330609B2Method and apparatus of inspecting a substrate with a component mounted thereonKOH YOUNG TECH INC·Filed 2015·Granted Jun 25, 2019·0 cites·15 claims
- 2351US9470752B2Board inspection apparatus and methodKOH YOUNG TECH INC·Filed 2013·Granted Oct 18, 2016·0 cites·7 claims
- 2450US11328407B2Method for inspecting mounting state of component, printed circuit board inspection apparatus, and computer readable recording mediumKOH YOUNG TECH INC·Filed 2019·Granted May 10, 2022·0 cites·16 claims
- 2550US8644590B2Method of measuring measurement targetJEONG JOONG-KI·Filed 2012·Granted Feb 4, 2014·0 cites·10 claims
- 2650US2008279458A1Imaging system for shape measurement of partially-specular object and method thereofKOREA ADVANCED INST SCI & TECH·Filed 2008·Application pending·0 cites
- 2747US8730464B2Method of inspecting a substrateJEONG JOONG-KI·Filed 2011·Granted May 20, 2014·0 cites·9 claims
- 2843US2014133735A1Method of inspecting a lead of an electric deviceKOH YOUNG TECH INC·Filed 2013·Application pending·0 cites
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