Inventor · disambiguated record
Michael C. Panis
Also filed as: PANIS MICHAEL · PANIS MICHAEL C
13 granted patents·159 citations·filing 1995–2023
91Inventor score
Files withTERADYNE INC13
Top patents by PatentIndex Score
13 records- 0181US7017087B2Enhanced loopback testing of serial devicesTERADYNE INC·Filed 2000·Granted Mar 21, 2006·26 cites·8 claims
- 0277US10896106B2Bus synchronization system that aggregates statusTERADYNE INC·Filed 2018·Granted Jan 19, 2021·3 cites·38 claims
- 0375US5689515AHigh speed serial data pin for automatic test equipmentTERADYNE INC·Filed 1996·Granted Nov 18, 1997·40 cites·13 claims
- 0472US7349818B2Determining frequency components of jitterTERADYNE INC·Filed 2005·Granted Mar 25, 2008·5 cites·10 claims
- 0570US5604751ATime linearity measurement using a frequency locked, dual sequencer automatic test systemTERADYNE INC·Filed 1995·Granted Feb 18, 1997·33 cites·7 claims
- 0660US6981192B2Deskewed differential detector employing analog-to-digital converterTERADYNE INC·Filed 2002·Granted Dec 27, 2005·9 cites·20 claims
- 0759US12461141B2Identifying failures in device coresTERADYNE INC·Filed 2023·Granted Nov 4, 2025·0 cites·23 claims
- 0859US7606675B2Jitter frequency determining systemTERADYNE INC·Filed 2008·Granted Oct 20, 2009·2 cites·6 claims
- 0959US7337377B2Enhanced loopback testing of serial devicesTERADYNE INC·Filed 2005·Granted Feb 26, 2008·3 cites·7 claims
- 1058US5938780AMethod for capturing digital data in an automatic test systemTERADYNE INC·Filed 1997·Granted Aug 17, 1999·21 cites·18 claims
- 1152US7668235B2Jitter measurement algorithm using locally in-order strobesTERADYNE INC·Filed 2005·Granted Feb 23, 2010·3 cites·39 claims
- 1252US7519490B2Determining frequency components of jitterTERADYNE INC·Filed 2008·Granted Apr 14, 2009·1 cites·8 claims
- 1347US6550036B1Pre-conditioner for measuring high-speed time intervals over a low-bandwidth pathTERADYNE INC·Filed 1999·Granted Apr 15, 2003·13 cites·30 claims
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