Inventor · disambiguated record
Jussi Tenhunen
Also filed as: TENHUNEN JUSSI
10 granted patents·3 pending applications·118 citations·filing 2000–2022
87Inventor score
Files withMETSO PAPER AUTOMATION OY2TEKNOLOGIAN TUTKIMUSKESKUS VTT OY2TIMEGATE INSTR OY2ANDRITZ OY1GLAXO GROUP LTD1
Top patents by PatentIndex Score
13 records- 0191US6870619B1Spectrometer and method for measuring optical spectrumVALTION TEKNILLINEN·Filed 2000·Granted Mar 22, 2005·73 cites·31 claims
- 0284US9395247B2Measurement of raman radiationOULUN YLIOPISTO·Filed 2014·Granted Jul 19, 2016·5 cites·23 claims
- 0380US8917388B2Measurement of raman radiationTENHUNEN JUSSI·Filed 2010·Granted Dec 23, 2014·6 cites·28 claims
- 0478US9261404B2Apparatus for testing samples using raman radiationGLAXO GROUP LTD·Filed 2012·Granted Feb 16, 2016·3 cites·11 claims
- 0577US6495831B1Method and apparatus for measuring properties of paperMETSO PAPER AUTOMATION OY·Filed 2000·Granted Dec 17, 2002·21 cites·13 claims
- 0668US9772228B2Device and method for optical measurement of a targetTEKNOLOGIAN TUTKIMUSKESKUS VTT OY·Filed 2014·Granted Sep 26, 2017·2 cites·13 claims
- 0767US6717148B2Method and apparatus for measuring coatingMETSO AUTOMATION OY·Filed 2002·Granted Apr 6, 2004·8 cites·33 claims
- 0847US2025052904A1Enhanced optical scanning module and deviceTEKNOLOGIAN TUTKIMUSKESKUS VTT OY·Filed 2022·Application pending·0 cites
- 0944US11965779B2Apparatus for measuring Raman spectrum and method thereofTIMEGATE INSTR OY·Filed 2020·Granted Apr 23, 2024·0 cites·19 claims
- 1042US2015377677A1Optical remote sensing system for process engineering controlANDRITZ OY·Filed 2014·Application pending·0 cites
- 1142US2003132387A1Method and device for measuring the amount of coating on a moving substrateMETSO PAPER AUTOMATION OY·Filed 2002·Application pending·0 cites
- 1232US10371641B2Method and apparatus for measuring inelastic scatteringTIMEGATE INSTR OY·Filed 2017·Granted Aug 6, 2019·0 cites·14 claims
- 1328US10444143B2Optical multi-channel measurement unit, optical multi-channel detector unit and a measurement method for measuring a property of an objectVALMET AUTOMATION OY·Filed 2015·Granted Oct 15, 2019·0 cites·14 claims
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