Inventor · disambiguated record
Ayako Shimazaki
Also filed as: SHIMAZAKI AYAKO
11 granted patents·182 citations·filing 1985–1997
91Inventor score
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11 records- 0169US5732120AFluorescent X-ray analyzing apparatusRIGAKU IND CORP·Filed 1997·Granted Mar 24, 1998·35 cites·7 claims
- 0266US5497407AContaminating-element analyzing methodTOSHIBA KK·Filed 1993·Granted Mar 5, 1996·28 cites·5 claims
- 0360US5430786AElement analyzing methodTOSHIBA KK·Filed 1993·Granted Jul 4, 1995·22 cites·7 claims
- 0449US5395446ASemiconductor treatment apparatusTOSHIBA KK·Filed 1993·Granted Mar 7, 1995·19 cites·14 claims
- 0546US5890501AMethod and device for dissolving surface layer of semiconductor substrateTOSHIBA KK·Filed 1996·Granted Apr 6, 1999·19 cites·15 claims
- 0646US5422925AContaminating-element analyzing method and apparatus of the sameTOSHIBA KK·Filed 1993·Granted Jun 6, 1995·12 cites·9 claims
- 0744US5633172AMethod for analying an impurity on a semiconductor substrateTOSHIBA KK·Filed 1994·Granted May 27, 1997·14 cites·90 claims
- 0842US5290733AMethod of manufacturing semiconductor devices including depositing aluminum on aluminum leadsTOSHIBA KK·Filed 1992·Granted Mar 1, 1994·12 cites·6 claims
- 0938US5490194AMethod and apparatus for analyzing contaminative element concentrationsTOSHIBA KK·Filed 1994·Granted Feb 6, 1996·7 cites·4 claims
- 1038US4634497AMethod and apparatus for decomposing semiconductor thin filmTOSHIBA KK·Filed 1985·Granted Jan 6, 1987·9 cites·21 claims
- 1135US5528648AMethod and apparatus for analyzing contaminative element concentrationsTOSHIBA KK·Filed 1994·Granted Jun 18, 1996·5 cites·5 claims
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