Inventor · disambiguated record
Tadashi Miyakawa
Also filed as: MIYAKAWA TADASHI
67 granted patents·4 pending applications·1,260 citations·filing 1977–2022
99Inventor score
Files withTOSHIBA KK30FUJI PHOTO FILM CO LTD20KUREHA CHEMICAL IND CO LTD6TOSHIBA MEMORY CORP6MIYAKAWA TADASHI5
Top patents by PatentIndex Score
71 records- 0197US4836652ALiquid crystal shutter array having microlenses corresponding to the pixel electrodesFUJI PHOTO FILM CO LTD·Filed 1987·Granted Jun 6, 1989·219 cites·7 claims
- 0290US5095461AErase circuitry for a non-volatile semiconductor memory deviceTOSHIBA KK·Filed 1989·Granted Mar 10, 1992·61 cites·42 claims
- 0390US5053841ANonvolatile semiconductor memoryTOSHIBA KK·Filed 1989·Granted Oct 1, 1991·66 cites·6 claims
- 0489US4790632ALiquid crystal device having the microlenses in correspondence with the pixel electrodesFUJI PHOTO FILM CO LTD·Filed 1987·Granted Dec 13, 1988·84 cites·10 claims
- 0587US5309256AMethod of and apparatus for processing image and correction chart employed in the apparatusFUJI PHOTO FILM CO LTD·Filed 1991·Granted May 3, 1994·104 cites·13 claims
- 0683US5805510AData erase mechanism for nonvolatile memory of boot block typeTOSHIBA KK·Filed 1997·Granted Sep 8, 1998·54 cites·11 claims
- 0782US6088281ASemiconductor memory deviceTOKYO SHIBAURA ELECTRIC CO·Filed 1998·Granted Jul 11, 2000·51 cites·27 claims
- 0881US9058886B2Power supply circuit and protection circuitTOSHIBA KK·Filed 2013·Granted Jun 16, 2015·4 cites·18 claims
- 0981US5202934AMethod of and apparatus for reading imageFUJI PHOTO FILM CO LTD·Filed 1991·Granted Apr 13, 1993·59 cites·6 claims
- 1081US4842379AImage recording apparatus utilizing an ECB mode liquid crystalFUJI PHOTO FILM CO LTD·Filed 1987·Granted Jun 27, 1989·34 cites·9 claims
- 1178US4687334AMethod for adjusting density of color picture in color picture output deviceFUJI PHOTO FILM CO LTD·Filed 1985·Granted Aug 18, 1987·33 cites·5 claims
- 1275US5920508ASemiconductor memory deviceTOSHIBA KK·Filed 1998·Granted Jul 6, 1999·35 cites·23 claims
- 1374US5981971ASemiconductor ROM wafer test structure, and IC cardTOSHIBA KK·Filed 1998·Granted Nov 9, 1999·45 cites·12 claims
- 1474US5636160ANonvolatile semiconductor memory having a stress relaxing voltage applied to erase gate during data writeTOSHIBA KK·Filed 1995·Granted Jun 3, 1997·30 cites·7 claims
- 1574US4845550AMethod and apparatus for processing picture image signalsFUJI PHOTO FILM CO LTD·Filed 1986·Granted Jul 4, 1989·28 cites·20 claims
- 1673US9368199B2Memory deviceTOSHIBA KK·Filed 2014·Granted Jun 14, 2016·4 cites·17 claims
- 1772US10049711B2Magnetoresistive memory deviceTOSHIBA MEMORY CORP·Filed 2016·Granted Aug 14, 2018·3 cites·28 claims
- 1872US9704918B2Semiconductor storage deviceMIYAKAWA TADASHI·Filed 2016·Granted Jul 11, 2017·3 cites·20 claims
- 1971US9299409B2Semiconductor storage deviceMIYAKAWA TADASHI·Filed 2014·Granted Mar 29, 2016·4 cites·19 claims
- 2070US5553026ANon-volatile semiconductor memory deviceTOSHIBA KK·Filed 1994·Granted Sep 3, 1996·28 cites·10 claims
- 2170US5153684ANonvolatile semiconductor memory device with offset transistorTOSHIBA KK·Filed 1991·Granted Oct 6, 1992·32 cites·5 claims
- 2268US5384742ANon-volatile semiconductor memoryTOSHIBA KK·Filed 1991·Granted Jan 24, 1995·27 cites·23 claims
- 2367US5223954ASystem for producing a halftone film or a printing plateFUJI PHOTO FILM CO LTD·Filed 1990·Granted Jun 29, 1993·26 cites·10 claims
- 2467US4974098AOriginal table for reading imagesFUJI PHOTO FILM CO LTD·Filed 1988·Granted Nov 27, 1990·23 cites·19 claims
- 2565US9208848B2Semiconductor storage deviceTOSHIBA KK·Filed 2014·Granted Dec 8, 2015·2 cites·16 claims
- 2665US8619455B2Ferroelectric memoryMIYAKAWA TADASHI·Filed 2011·Granted Dec 31, 2013·3 cites·18 claims
- 2764US6522569B2Semiconductor memory deviceTOSHIBA KK·Filed 2001·Granted Feb 18, 2003·13 cites·23 claims
- 2863US8116112B2Semiconductor memory deviceMIYAKAWA TADASHI·Filed 2009·Granted Feb 14, 2012·5 cites·12 claims
- 2963US6522589B1Semiconductor apparatus and mode setting method for semiconductor apparatusTOSHIBA KK·Filed 2001·Granted Feb 18, 2003·11 cites·46 claims
- 3062US11101319B2Semiconductor storage device including variable resistance elementsTOSHIBA MEMORY CORP·Filed 2020·Granted Aug 24, 2021·0 cites·20 claims
- 3161US12148469B2Method for manufacturing memory system including a storage deviceKIOXIA CORP·Filed 2022·Granted Nov 19, 2024·0 cites·20 claims
- 3261US7486578B2Test method for ferroelectric memoryTOSHIBA KK·Filed 2007·Granted Feb 3, 2009·4 cites·20 claims
- 3361US4862285AMethod of changing image magnificationFUJI PHOTO FILM CO LTD·Filed 1987·Granted Aug 29, 1989·16 cites·5 claims
- 3461US4670778AMethod of correcting phosphor luminance unevenness in a color fiber optic cathode-ray tubeFUJI PHOTO FILM CO LTD·Filed 1984·Granted Jun 2, 1987·13 cites·4 claims
- 3560US10783946B2Semiconductor memory device including memory cell arraysTOSHIBA MEMORY CORP·Filed 2019·Granted Sep 22, 2020·1 cites·19 claims
- 3660US5084762AUnder-color removal method and device thereforFUJI PHOTO FILM CO LTD·Filed 1989·Granted Jan 28, 1992·15 cites·8 claims
- 3759US6707736B2Semiconductor memory deviceTOSHIBA KK·Filed 2002·Granted Mar 16, 2004·10 cites·18 claims
- 3859US5811555AMethod for substitution of an amino group of a primary amine by a chlorine atom and a synthetic method by application thereofKUREHA CHEMICAL IND CO LTD·Filed 1996·Granted Sep 22, 1998·8 cites·6 claims
- 3957US9646667B2Semiconductor memory deviceTOSHIBA KK·Filed 2016·Granted May 9, 2017·1 cites·20 claims
- 4052US7257011B2Semiconductor memory having twisted bit line architectureTOSHIBA KK·Filed 2005·Granted Aug 14, 2007·2 cites·20 claims
- 4152US5566113ASemiconductor memory circuit having verify modeTOSHIBA KK·Filed 1995·Granted Oct 15, 1996·14 cites·14 claims
- 4251US4144587ACounting level "1" bits to minimize ROM active elementsTOKYO SHIBAURA ELECTRIC CO·Filed 1977·Granted Mar 13, 1979·7 cites·2 claims
- 4351US2018277595A1Semiconductor storage deviceTOSHIBA MEMORY CORP·Filed 2018·Application pending·0 cites
- 4450US7218546B2Integrated circuit device provided with series-connected TC parallel unit ferroelectric memory and method for testing the sameTOSHIBA KK·Filed 2005·Granted May 15, 2007·2 cites·19 claims
- 4550US7209398B2Semiconductor memory device having redundancy cell array shared by a plurality of memory cell arraysTOSHIBA KK·Filed 2004·Granted Apr 24, 2007·6 cites·18 claims
- 4648US4920411AMethod for processing image signals so as to color correct themFUJI PHOTO FILM CO LTD·Filed 1988·Granted Apr 24, 1990·9 cites·6 claims
- 4747US5787034ANonvolatile semiconductor memory having a stress relaxing voltage applied to erase gate during data writeTOSHIBA KK·Filed 1997·Granted Jul 28, 1998·9 cites·9 claims
- 4845US5917750ANonvolatile semiconductor memory with a protect circuitTOSHIBA KK·Filed 1997·Granted Jun 29, 1999·9 cites·38 claims
- 4944US10056128B2Semiconductor storage deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Aug 21, 2018·0 cites·20 claims
- 5043US9824738B2Semiconductor storage deviceTOSHIBA MEMORY CORP·Filed 2016·Granted Nov 21, 2017·0 cites·18 claims
Showing the top 50 of 71 patent records by PatentIndex Score.
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