Inventor · disambiguated record

Koichi Shiroyama

Also filed as: SHIROYAMA KOICHI

1 granted patent·2 citations·filing 2011–2011

18Inventor score

Technology areasH10P

Files withMATSUMURA SHIGERU1

Top patents by PatentIndex Score

1 record

0160US8922232B2Test-use individual substrate, probe, and semiconductor wafer testing apparatusMATSUMURA SHIGERU·Filed 2011·Granted Dec 30, 2014·2 cites·12 claims

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