Inventor · disambiguated record
Katsushi Sugai
Also filed as: SUGAI KATSUSHI
3 granted patents·1 pending application·5 citations·filing 2010–2024
58Inventor score
Top patents by PatentIndex Score
4 records- 0163US8779791B2Method of manufacturing probe having boards connected by magnetsUMEMURA YOSHIHARU·Filed 2010·Granted Jul 15, 2014·2 cites·6 claims
- 0260US8922232B2Test-use individual substrate, probe, and semiconductor wafer testing apparatusMATSUMURA SHIGERU·Filed 2011·Granted Dec 30, 2014·2 cites·12 claims
- 0354US9176169B2Probe apparatus and test apparatusADVANTEST CORP·Filed 2013·Granted Nov 3, 2015·1 cites·2 claims
- 0454US2025164549A1Cooling plate, wiring board assembly and device testing apparatusADVANTEST CORP·Filed 2024·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →