Inventor · disambiguated record
Robert Alan Hoult
Also filed as: HOULT ROBERT · HOULT ROBERT A · HOULT ROBERT ALAN
43 granted patents·3 pending applications·723 citations·filing 1976–2019
98Inventor score
Files withPERKIN ELMER CORP12HOULT ROBERT ALAN9PERKINELMER SINGAPORE PTE LTD9PERKIN ELMER INT CV4PERKIN ELMER LTD4
Top patents by PatentIndex Score
46 records- 0193US5303165AStandardizing and calibrating a spectrometric instrumentPERKIN ELMER CORP·Filed 1992·Granted Apr 12, 1994·119 cites·51 claims
- 0291US5308982AMethod and apparatus for comparing spectraPERKIN ELMER CORP·Filed 1992·Granted May 3, 1994·126 cites·22 claims
- 0388US8284484B2Relating to scanning confocal microscopyHOULT ROBERT ALAN·Filed 2007·Granted Oct 9, 2012·49 cites·34 claims
- 0483US5914780ADigitisation of interferograms in Fourier transform spectroscopyPERKIN ELMER LTD·Filed 1997·Granted Jun 22, 1999·80 cites·26 claims
- 0581US6610982B2Suppression of undesired components in the measured spectra of spectrometersPERKINELMER INSTRUMENTS LLC·Filed 2003·Granted Aug 26, 2003·20 cites·10 claims
- 0679US5023804AMethod and apparatus for comparing spectraPERKIN ELMER CORP·Filed 1989·Granted Jun 11, 1991·37 cites·10 claims
- 0778US6049762AStandardizing a spectrometric instrumentPERKIN ELMER LLC·Filed 1997·Granted Apr 11, 2000·58 cites·80 claims
- 0877US8223430B2Accessory for attenuated total internal reflectance (ATR) spectroscopyHOULT ROBERT ALAN·Filed 2007·Granted Jul 17, 2012·6 cites·23 claims
- 0973US7935929B2Accessory for attenuated total internal reflectance (ATR) spectroscopyPERKINELMER SINGAPORE PTE LTD·Filed 2007·Granted May 3, 2011·4 cites·15 claims
- 1072US9976949B2Diffuse reflectance infrared Fourier transform spectroscopyPERKINELMER SINGAPORE PTE LTD·Filed 2014·Granted May 22, 2018·1 cites·19 claims
- 1171US8169515B2Processing data from a CCD and CCD imaging apparatus to correct smearing artifactsWILKINSON ANTONIO CANAS·Filed 2009·Granted May 1, 2012·4 cites·29 claims
- 1271US5077481AOptical probe for measuring light transmission of liquidPERKIN ELMER CORP·Filed 1990·Granted Dec 31, 1991·36 cites·8 claims
- 1371US4052661ANuclear magnetic resonance probePERKIN ELMER CORP·Filed 1976·Granted Oct 4, 1977·21 cites·12 claims
- 1467US11156549B2Diffuse reflectance infrared fourier transform spectroscopyPERKINELMER SINGAPORE PTE LTD·Filed 2019·Granted Oct 26, 2021·0 cites·36 claims
- 1567US8223429B2Accessory for attenuated total internal reflective (ATR) spectroscopyHOULT ROBERT ALAN·Filed 2007·Granted Jul 17, 2012·3 cites·11 claims
- 1666US10337990B2Identifying presence of substancesPERKINELMER SINGAPORE PTE LTD·Filed 2014·Granted Jul 2, 2019·2 cites·26 claims
- 1766US8400711B2Accessory for attenuated total internal reflectance (ATR) spectroscopyHOULT ROBERT ALAN·Filed 2007·Granted Mar 19, 2013·3 cites·23 claims
- 1865US5056886AOptical switching devicePERKIN ELMER CORP·Filed 1990·Granted Oct 15, 1991·28 cites·6 claims
- 1963US7560697B2Detector array and cross-talk linearity connectionPERKINELMER SINGAPORE PTE LTD·Filed 2006·Granted Jul 14, 2009·3 cites·19 claims
- 2062US10473584B2Diffuse reflectance infrared Fourier transform spectroscopyPERKINELMER SINGAPORE PTE LTD·Filed 2018·Granted Nov 12, 2019·0 cites·32 claims
- 2161US7521696B2Method and apparatus for analyzing a dynamic samplePERKINELMER SINGAPORE PTE LTD·Filed 2005·Granted Apr 21, 2009·1 cites·10 claims
- 2260US10578550B2Identifying presence of substratesPERKINELMER SINGAPORE PTE LTD·Filed 2019·Granted Mar 3, 2020·0 cites·26 claims
- 2359US9213008B2Differential scanning calorimetry and calibration methods for use therewithHOULT ROBERT ALAN·Filed 2010·Granted Dec 15, 2015·1 cites·18 claims
- 2459US4621899AAssembly for positioning an optical elementPERKIN ELMER CORP·Filed 1984·Granted Nov 11, 1986·15 cites·8 claims
- 2558US5974210AProbe for spectroscopic analysisPERKIN ELMER LTD·Filed 1998·Granted Oct 26, 1999·21 cites·11 claims
- 2657US7378657B2Small detector array for infrared imaging microscopePERKIN ELMER INT CV·Filed 2001·Granted May 27, 2008·5 cites·32 claims
- 2753US4881814AScanning Michelson interferometer assemblyPERKIN ELMER CORP·Filed 1988·Granted Nov 21, 1989·14 cites·16 claims
- 2851US10018561B2Diamond ATR artefact correctionPERKINELMER SINGAPORE PTE LTD·Filed 2013·Granted Jul 10, 2018·0 cites·25 claims
- 2951US7057733B2Scanning IR microscopePERKIN ELMER INT CV·Filed 2004·Granted Jun 6, 2006·3 cites·6 claims
- 3051US4974209AInteractive smoothing systemPERKIN ELMER CORP·Filed 1990·Granted Nov 27, 1990·16 cites·7 claims
- 3151US4682022ADetector preamplifier for use with a MCT detectorPERKIN ELMER CORP·Filed 1985·Granted Jul 21, 1987·12 cites·12 claims
- 3249US8345235B2Measurement of sample reflectancePERKINELMER HEALTH SCI INC·Filed 2009·Granted Jan 1, 2013·1 cites·31 claims
- 3348US8743456B2Systems and methods for attenuated total internal reflectance (ATR) spectroscopyHOULT ROBERT ALAN·Filed 2013·Granted Jun 3, 2014·0 cites·9 claims
- 3446US2008135763A1Small Detector Array For Infrared Imaging MicroscopeHOULT ROBERT ALAN·Filed 2008·Application pending·0 cites
- 3545US9322703B2Spectroscopic instrumentHOULT ROBERT ALAN·Filed 2011·Granted Apr 26, 2016·0 cites·20 claims
- 3644US5218428AOptical transmittance apparatus for fluidsPERKIN ELMER CORP·Filed 1991·Granted Jun 8, 1993·11 cites·22 claims
- 3741US2012194704A1Processing Data From A CCD And CCD Imaging Apparatus To Correct Smearing ArtifactsCANAS WILKINSON ANTONIO·Filed 2012·Application pending·0 cites
- 3838US5703681ACarrier and its use in the preparation of samples for spectroscopyPERKIN ELMER LTD·Filed 1996·Granted Dec 30, 1997·5 cites·9 claims
- 3937US7595884B2Measurement of sample reflectancePERKINELMER LAS INC·Filed 2005·Granted Sep 29, 2009·0 cites·4 claims
- 4037US2002034000A1Dual magnification for infrared imaging microscopeFiled 2001·Application pending·0 cites
- 4135US5877435ACarrier and its use in the preparation of samples for spectroscopyPERKIN ELMER LTD·Filed 1997·Granted Mar 2, 1999·3 cites·6 claims
- 4234US6518573B1Suppression of undesired components in the measured spectra of spectrometersWELLESLEY INTERNAT C V·Filed 1999·Granted Feb 11, 2003·5 cites·16 claims
- 4334US6121052AReflectance sampler and method of usePERKIN ELMER INT CV·Filed 1997·Granted Sep 19, 2000·3 cites·6 claims
- 4432US5099116AOptical device for measuring displacementPERKIN ELMER CORP·Filed 1990·Granted Mar 24, 1992·2 cites·18 claims
- 4531US9250127B2Spectroscopic instruments and foot portions for spectroscopic instrumentsHOULT ROBERT ALAN·Filed 2011·Granted Feb 2, 2016·0 cites·13 claims
- 4628US6091554AMounting of optical componentsPERKIN ELMER INT CV·Filed 1998·Granted Jul 18, 2000·5 cites·7 claims
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