Inventor · disambiguated record
Michael Schittenhelm
Also filed as: SCHITTENHELM MICHAEL
16 granted patents·3 pending applications·146 citations·filing 2001–2007
93Inventor score
Top patents by PatentIndex Score
19 records- 0180US6556492B2System for testing fast synchronous semiconductor circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 29, 2003·31 cites·10 claims
- 0275US6744272B2Test circuitFiled 2002·Granted Jun 1, 2004·25 cites·11 claims
- 0370US6515319B2Field-effect-controlled transistor and method for fabricating the transistorINFINEON TECHNOLOGIES AG·Filed 2001·Granted Feb 4, 2003·17 cites·6 claims
- 0464US6721904B2System for testing fast integrated digital circuits, in particular semiconductor memory modulesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 13, 2004·15 cites·29 claims
- 0561US6871306B2Method and device for reading and for checking the time position of data response signals read out from a memory module to be testedINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 22, 2005·12 cites·20 claims
- 0660US6897646B2Method for testing wafers to be tested and calibration apparatusINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 24, 2005·11 cites·10 claims
- 0753US7117404B2Test circuit for testing a synchronous memory circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 3, 2006·8 cites·6 claims
- 0853US6618305B2Test circuit for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 9, 2003·8 cites·9 claims
- 0948US6865707B2Test data generatorINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 8, 2005·6 cites·20 claims
- 1048US6724181B2Method of calibrating a test system for semiconductor components, and test substrateINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 20, 2004·4 cites·6 claims
- 1145US7062690B2System for testing fast synchronous digital circuits, particularly semiconductor memory chipsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 13, 2006·3 cites·16 claims
- 1241US6862702B2Address counter for addressing synchronous high-frequency digital circuits, in particular memory devicesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 1, 2005·3 cites·10 claims
- 1341US6839397B2Circuit configuration for generating control signals for testing high-frequency synchronous digital circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jan 4, 2005·3 cites·11 claims
- 1436US2009085596A1System and method for testing semiconductor devicesQIMONDA AG·Filed 2007·Application pending·0 cites
- 1534US7117403B2Method and device for generating digital signal patternsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Oct 3, 2006·0 cites·18 claims
- 1634US2003005389A1Test circuit for testing a synchronous circuitFiled 2002·Application pending·0 cites
- 1734US2007132475A1Semiconductor device test method and deviceCARNEIRO LEAO ANA M S·Filed 2006·Application pending·0 cites
- 1832US7426669B2Circuit arrangement and method for driving electronic chipsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Sep 16, 2008·0 cites·16 claims
- 1931US6957373B2Address generator for generating addresses for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 18, 2005·0 cites·10 claims
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