Inventor · disambiguated record
Hideto Iwaoka
Also filed as: IWAOKA HIDETO
25 granted patents·1 pending application·882 citations·filing 1976–2002
97Inventor score
Files withYOKOGAWA ELECTRIC CORP11YOKOGAWA HOKUSHIN ELECTRIC8OPTICAL MEASUREMENT TECHNOLOGY4TERATEC CORP1YOKOGAWA ELECTRIC CORP A JAPAN1
Top patents by PatentIndex Score
26 records- 0195US4912526AOptical frequency synthesizer/sweeperYOKOGAWA ELECTRIC CORP·Filed 1989·Granted Mar 27, 1990·69 cites·2 claims
- 0294US4629886AHigh resolution digital diffraction grating scale encoderYOKOGAWA HOKUSHIN ELECTRIC·Filed 1984·Granted Dec 16, 1986·55 cites·9 claims
- 0392US6590710B2Fabry-Perot filter, wavelength-selective infrared detector and infrared gas analyzer using the filter and detectorYOKOGAWA ELECTRIC CORP·Filed 2001·Granted Jul 8, 2003·116 cites·12 claims
- 0488US4856899AOptical frequency analyzer using a local oscillator heterodyne detection of incident lightYOKOGAWA ELECTRIC CORP·Filed 1986·Granted Aug 15, 1989·95 cites·34 claims
- 0587US4893353AOptical frequency synthesizer/sweeperYOKOGAWA ELECTRIC CORP·Filed 1986·Granted Jan 9, 1990·51 cites·36 claims
- 0686US4665368ANMR imaging apparatusYOKOGAWA HOKUSHIN ELECTRIC·Filed 1985·Granted May 12, 1987·48 cites·9 claims
- 0785US4833681ASemiconductor laser wavelength stabilizerYOKOGAWA ELECTRIC CORP·Filed 1986·Granted May 23, 1989·64 cites·17 claims
- 0877US4772843ATime measuring apparatusYOKOGAWA ELECTRIC CORP·Filed 1987·Granted Sep 20, 1988·38 cites·2 claims
- 0975US4700136ANMR imaging apparatusYOKOGAWA ELECTRIC CORP·Filed 1985·Granted Oct 13, 1987·30 cites·4 claims
- 1073US5077752ASemiconductor laserOPTICAL MEASUREMENT TECHNOLOGY·Filed 1990·Granted Dec 31, 1991·34 cites·6 claims
- 1173US4663592ANMR image forming apparatusYOKOGAWA HOKUSHIN ELECTRIC·Filed 1985·Granted May 5, 1987·28 cites·2 claims
- 1271US4651097AExamination method and apparatus utilizing nuclear magnetic resonanceYOKOGAWA HOKUSHIN ELECTRIC·Filed 1984·Granted Mar 17, 1987·23 cites·47 claims
- 1370US5061030AOptical integrated modulatorOPTICAL MEASUREMENT TECHNOLOGY·Filed 1990·Granted Oct 29, 1991·36 cites·8 claims
- 1467US4684889ANMR apparatus compensated for primary field changesYOKOGAWA HOKUSHIN ELECTRIC·Filed 1985·Granted Aug 4, 1987·23 cites·2 claims
- 1567US4623864AMagnetic field production coil for nuclear magnetic resonance imaging apparatusYOKOGAWA HOKUSHIN ELECTRIC·Filed 1985·Granted Nov 18, 1986·22 cites·3 claims
- 1667US4584548AMagnetic field generating coil assembly for nuclear magnetic resonance imaging apparatusYOKOGAWA HOKUSHIN ELECTRIC·Filed 1985·Granted Apr 22, 1986·17 cites·2 claims
- 1765US5289494ADistributed feedback semiconductor laserOPTICAL MEASUREMENT TECHNOLOGY·Filed 1991·Granted Feb 22, 1994·24 cites·7 claims
- 1862US4536712AMethod and apparatus for examination by nuclear magnetic resonanceYOKOGAWA HOKUSHIN ELECTRIC·Filed 1983·Granted Aug 20, 1985·16 cites·7 claims
- 1959US4694250ANuclear magnetic resonance imaging deviceYOKOGAWA ELECTRIC CORP·Filed 1986·Granted Sep 15, 1987·26 cites·29 claims
- 2056US5583446AElectro-optically controlled measurement probe systemTERATEC CORP·Filed 1994·Granted Dec 10, 1996·18 cites·12 claims
- 2142US4700138AAutomatic gain control apparatus for NMR imaging systemYOKOGAWA ELECTRIC CORP·Filed 1986·Granted Oct 13, 1987·25 cites·2 claims
- 2238US4768847AHologram scannerYOKOGAWA ELECTRIC CORP·Filed 1984·Granted Sep 6, 1988·6 cites·3 claims
- 2336US4716370ACoil arrangement for producing static magnetic fieldYOKOGAWA ELECTRIC CORP·Filed 1985·Granted Dec 29, 1987·4 cites·2 claims
- 2435US5189309AAvalanche photodiode with alinasp cap layerOPTICAL MEASUREMENT TECHNOLOGY·Filed 1991·Granted Feb 23, 1993·9 cites·2 claims
- 2535US2003116711A1Fabry-perot filter, wavelength-selective infrared detector and infrared gas analyzer using the filter and detectorYOKOGAWA ELECTRIC CORP A JAPAN·Filed 2002·Application pending·0 cites
- 2631US4063150AResonance thermometerYOKOGAWA ELECTRIC WORKS LTD·Filed 1976·Granted Dec 13, 1977·5 cites·2 claims
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