Inventor · disambiguated record
Chih-Hsing Yu
Also filed as: YU CHIH-HSING
14 granted patents·1,035 citations·filing 1995–2004
94Inventor score
Files withTAIWAN SEMICONDUCTOR MFG10IND TECH RES INST1SEMICONDUCTOR MFG INT SHANGHAI1WORLDWIDE SEMICONDUCTOR MANUFA1WORLDWIDE SEMICONDUCTOR MFG1
Top patents by PatentIndex Score
14 records- 0198US6472266B1Method to reduce bit line capacitance in cub dramsTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Oct 29, 2002·619 cites·21 claims
- 0292US6624018B1Method of fabricating a DRAM device featuring alternate fin type capacitor structuresTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Sep 23, 2003·78 cites·27 claims
- 0385US6486025B1Methods for forming memory cell structuresTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Nov 26, 2002·36 cites·12 claims
- 0485US6294426B1Method of fabricating a capacitor under bit line structure with increased capacitance without increasing the aspect ratio for a dry etched bit line contact holeTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Sep 25, 2001·41 cites·24 claims
- 0582US6555442B1Method of forming shallow trench isolation with rounded corner and divot-free by using disposable spacerTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Apr 29, 2003·35 cites·37 claims
- 0682US6300191B1Method of fabricating a capacitor under bit line structure for a dynamic random access memory deviceTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Oct 9, 2001·36 cites·31 claims
- 0779US6372572B1Method of planarizing peripheral circuit region of a DRAMTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Apr 16, 2002·25 cites·18 claims
- 0877US5819286AVideo database indexing and query method and systemIND TECH RES INST·Filed 1995·Granted Oct 6, 1998·96 cites·14 claims
- 0969US6531358B1Method of fabricating capacitor-under-bit line (CUB) DRAMTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Mar 11, 2003·17 cites·26 claims
- 1069US6444575B1Method for forming a bitline contact via within a memory cell structureTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Sep 3, 2002·16 cites·17 claims
- 1165US7033846B2Method for manufacturing semiconductor devices by monitoring nitrogen bearing species in gate oxide layerSEMICONDUCTOR MFG INT SHANGHAI·Filed 2004·Granted Apr 25, 2006·10 cites·20 claims
- 1254US6627493B2Self-aligned method for fabricating a capacitor under bit-line (cub) dynamic random access memory (DRAM) cell structureTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Sep 30, 2003·6 cites·15 claims
- 1354US6100136AMethod of fabricating capacitor capable of maintaining the height of the peripheral area of the capacitorWORLDWIDE SEMICONDUCTOR MANUFA·Filed 1999·Granted Aug 8, 2000·15 cites·10 claims
- 1437US6197652B1Fabrication method of a twin-tub capacitorWORLDWIDE SEMICONDUCTOR MFG·Filed 1999·Granted Mar 6, 2001·5 cites·18 claims
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