Inventor · disambiguated record
Mitsugi Ogura
Also filed as: OGURA MITSUGI
23 granted patents·723 citations·filing 1981–2014
96Inventor score
Top patents by PatentIndex Score
23 records- 0198US4800530ASemiconductor memory system with dynamic random access memory cellsKABUSHIKI KASIHA TOSHIBA·Filed 1987·Granted Jan 24, 1989·172 cites·11 claims
- 0297US4630088AMOS dynamic ramTOSHIBA KK·Filed 1985·Granted Dec 16, 1986·139 cites·27 claims
- 0393US4636981ASemiconductor memory device having a voltage push-up circuitTOKYO SHIBAURA ELECTRIC CO·Filed 1983·Granted Jan 13, 1987·68 cites·4 claims
- 0481US4706249ASemiconductor memory device having error detection/correction functionTOSHIBA KK·Filed 1985·Granted Nov 10, 1987·72 cites·12 claims
- 0579US9627658B2Battery and battery packTOSHIBA KK·Filed 2014·Granted Apr 18, 2017·3 cites·6 claims
- 0677US4799193ASemiconductor memory devicesTOSHIBA KK·Filed 1986·Granted Jan 17, 1989·33 cites·33 claims
- 0776US4992389AMaking a self aligned semiconductor deviceTOSHIBA KK·Filed 1988·Granted Feb 12, 1991·36 cites·1 claims
- 0875US5942784ASemiconductor deviceTOSHIBA KK·Filed 1997·Granted Aug 24, 1999·38 cites·7 claims
- 0971US4748596ASemiconductor memory device with sense amplifiersTOSHIBA KK·Filed 1985·Granted May 31, 1988·27 cites·10 claims
- 1065US4644184AMemory clock pulse generating circuit with reduced peak current requirementsTOKYO SHIBAURA ELECTRIC CO·Filed 1983·Granted Feb 17, 1987·16 cites·1 claims
- 1165US4433911AMethod of evaluating measure precision of patterns and photomask thereforTOKYO SHIBAURA ELECTRIC CO·Filed 1982·Granted Feb 28, 1984·17 cites·15 claims
- 1262US4688064ADynamic memory cell and method for manufacturing the sameTOSHIBA KK·Filed 1985·Granted Aug 18, 1987·19 cites·2 claims
- 1358US4763178ASemiconductor memory deviceTOKYO SHIBAURA ELECTRIC CO·Filed 1986·Granted Aug 9, 1988·18 cites·11 claims
- 1456US4725985ACircuit for applying a voltage to a memory cell MOS capacitor of a semiconductor memory deviceTOSHIBA KK·Filed 1984·Granted Feb 16, 1988·10 cites·4 claims
- 1543US5635850AIntelligent test line systemTOSHIBA KK·Filed 1994·Granted Jun 3, 1997·13 cites·3 claims
- 1640US4798794AMethod for manufacturing dynamic memory cellTOSHIBA KK·Filed 1987·Granted Jan 17, 1989·6 cites·10 claims
- 1738US4881113ASemiconductor integrated circuits with a protection deviceTOSHIBA KK·Filed 1986·Granted Nov 14, 1989·8 cites·27 claims
- 1838US4564854ACombined MOS/memory transistor structureTOKYO SHIBAURA ELECTRIC CO·Filed 1983·Granted Jan 14, 1986·8 cites·4 claims
- 1938US4490628AMOS Decoder selection circuit having a barrier transistor whose non-conduction period is unaffected by substrate potential disturbancesTOKYO SHIBAURA ELECTRIC CO·Filed 1981·Granted Dec 25, 1984·3 cites·11 claims
- 2037US5227319AMethod of manufacturing a semiconductor deviceTOSHIBA KK·Filed 1991·Granted Jul 13, 1993·7 cites·7 claims
- 2136US4492973AMOS Dynamic memory cells and method of fabricating the sameTOKYO SHIBAURA ELECTRIC CO·Filed 1981·Granted Jan 8, 1985·4 cites·10 claims
- 2234US5095463ASemiconductor memory deviceTOSHIBA KK·Filed 1990·Granted Mar 10, 1992·4 cites·3 claims
- 2331US4611237ASemiconductor integrated circuit deviceTOKYO SHIBAURA ELECTRIC CO·Filed 1984·Granted Sep 9, 1986·2 cites·3 claims
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