Inventor · disambiguated record
William D. Farwell
Also filed as: FARWELL WILLIAM D
39 granted patents·947 citations·filing 1981–2010
98Inventor score
Files withHUGHES AIRCRAFT CO26RAYTHEON CO10FARWELL WILLIAM D1HUGHES ELECTRONICS CORP1LEWINS LLOYD J1
Top patents by PatentIndex Score
39 records- 0195US5184516AConformal circuit for structural health monitoring and assessmentHUGHES AIRCRAFT CO·Filed 1991·Granted Feb 9, 1993·129 cites·20 claims
- 0292US5576645ASample and hold flip-flop for CMOS logicHUGHES AIRCRAFT CO·Filed 1995·Granted Nov 19, 1996·106 cites·3 claims
- 0390US7795927B2Digital circuits with adaptive resistance to single event upsetRAYTHEON CO·Filed 2007·Granted Sep 14, 2010·14 cites·18 claims
- 0487US5717702AScan testing digital logic with differing frequencies of system clock and test clockHUGHES AIRCRAFT CO·Filed 1996·Granted Feb 10, 1998·82 cites·1 claims
- 0584US5233161AMethod for self regulating CMOS digital microcircuit burn-in without ovensHUGHES AIRCRAFT CO·Filed 1991·Granted Aug 3, 1993·62 cites·6 claims
- 0679US6920545B2Reconfigurable processor with alternately interconnected arithmetic and memory nodes of crossbar switched clusterRAYTHEON CO·Filed 2002·Granted Jul 19, 2005·24 cites·7 claims
- 0777US5896259APreheating device for electronic circuitsRAYTHEON CO·Filed 1997·Granted Apr 20, 1999·61 cites·15 claims
- 0877US5181191ABuilt-in test circuitry providing simple and accurate AC test of digital microcircuits with low bandwidth test equipment and probe stationsHUGHES AIRCRAFT CO·Filed 1991·Granted Jan 19, 1993·41 cites·8 claims
- 0976US8040157B2Digital circuits with adaptive resistance to single event upsetRAYTHEON CO·Filed 2010·Granted Oct 18, 2011·3 cites·44 claims
- 1073US5457381AMethod for testing the electrical parameters of inputs and outputs of integrated circuits without direct physical contactHUGHES AIRCRAFT CO·Filed 1992·Granted Oct 10, 1995·34 cites·9 claims
- 1173US5202625AMethod of testing interconnections in digital systems by the use of bidirectional driversHUGHES AIRCRAFT CO·Filed 1991·Granted Apr 13, 1993·62 cites·4 claims
- 1264US5528610ABoundary test cell with self masking capabilityHUGHES AIRCRAFT CO·Filed 1992·Granted Jun 18, 1996·27 cites·3 claims
- 1363US5473617AHigh impedance technique for testing interconnections in digital systemsHUGHES AIRCRAFT CO·Filed 1993·Granted Dec 5, 1995·23 cites·3 claims
- 1462US5870445AFrequency independent clock synchronizerRAYTHEON CO·Filed 1995·Granted Feb 9, 1999·40 cites·4 claims
- 1562US5351000AMethod of cancelling offset errors in phase detectorsHUGHES AIRCRAFT CO·Filed 1993·Granted Sep 27, 1994·24 cites·3 claims
- 1659US5670865ACircuit to improve the transient response of step-down DC to DC convertersHUGHES AIRCRAFT CO·Filed 1996·Granted Sep 23, 1997·26 cites·6 claims
- 1757US6671754B1Techniques for alignment of multiple asynchronous data sourcesRAYTHEON CO·Filed 2000·Granted Dec 30, 2003·5 cites·11 claims
- 1857US5291141AMethod for continuously measuring delay margins in digital systemsHUGHES AIRCRAFT CO·Filed 1991·Granted Mar 1, 1994·12 cites·3 claims
- 1956US6948080B2System and method for minimizing upsets in digital microcircuits via ambient radiation monitoringRAYTHEON CO·Filed 2002·Granted Sep 20, 2005·4 cites·18 claims
- 2055US5642364AContactless testing of inputs and outputs of integrated circuitsHUGHES AIRCRAFT CO·Filed 1996·Granted Jun 24, 1997·18 cites·5 claims
- 2153US6667519B2Mixed technology microcircuitsRAYTHEON CO·Filed 2001·Granted Dec 23, 2003·6 cites·6 claims
- 2253US5396183AMethod for continuously measuring delay margins in digital systemsHUGHES AIRCRAFT CO·Filed 1993·Granted Mar 7, 1995·10 cites·2 claims
- 2353US4445138AReal time dynamic range compression for image enhancementHUGHES AIRCRAFT CO·Filed 1981·Granted Apr 24, 1984·23 cites·15 claims
- 2449US5731726AControllable precision on-chip delay elementHUGHES AIRCRAFT CO·Filed 1996·Granted Mar 24, 1998·12 cites·4 claims
- 2548US5606565AMethod of applying boundary test patternsHUGHES AIRCRAFT CO·Filed 1995·Granted Feb 25, 1997·16 cites·4 claims
- 2646US5488309AMethod of testing the output propagation delay of digital devicesHUGHES AIRCRAFT CO·Filed 1993·Granted Jan 30, 1996·11 cites·3 claims
- 2742US6775248B1Programmable bandwidth allocation between send and receive in a duplex communication pathRAYTHEON CO·Filed 2000·Granted Aug 10, 2004·2 cites·4 claims
- 2842US6038518AError correction of system transfer function by use of input compensationHUGHES ELECTRONICS CORP·Filed 1997·Granted Mar 14, 2000·14 cites·14 claims
- 2942US5329167ATest flip-flop with an auxillary latch enabling two (2) bits of storageHUGHES AIRCRAFT CO·Filed 1992·Granted Jul 12, 1994·9 cites·6 claims
- 3041US8278979B2Digital circuits with adaptive resistance to single event upsetFARWELL WILLIAM D·Filed 2010·Granted Oct 2, 2012·0 cites·19 claims
- 3138US9081901B2Means of control for reconfigurable computersLEWINS LLOYD J·Filed 2007·Granted Jul 14, 2015·0 cites·25 claims
- 3238US5703790ASeries connection of multiple digital devices to a single power sourceHUGHES AIRCRAFT CO·Filed 1996·Granted Dec 30, 1997·10 cites·6 claims
- 3338US5384494AProgrammable hold-off for integrated circuit I/O pinsHUGHES AIRCRAFT CO·Filed 1993·Granted Jan 24, 1995·8 cites·2 claims
- 3437US5412580APseudo-random vector generated testable counterHUGHES AIRCRAFT CO·Filed 1991·Granted May 2, 1995·7 cites·18 claims
- 3535US5563507AMethod of testing the interconnection between logic devicesHUGHES AIRCRAFT CO·Filed 1994·Granted Oct 8, 1996·5 cites·4 claims
- 3635US5198760AMethod by which to detect direction of current flow in outputs of integrated circuitsHUGHES AIRCRAFT CO·Filed 1991·Granted Mar 30, 1993·5 cites·5 claims
- 3735US5070257ACircuitry for controlled rate of power application to CMOS microcircuitsHUGHES AIRCRAFT CO·Filed 1990·Granted Dec 3, 1991·3 cites·11 claims
- 3834US6324664B1Means for testing dynamic integrated circuitsRAYTHEON CO·Filed 1999·Granted Nov 27, 2001·6 cites·16 claims
- 3934US5708380ATest for hold time margins in digital systemsHUGHES AIRCRAFT CO·Filed 1996·Granted Jan 13, 1998·3 cites·5 claims
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