Inventor · disambiguated record
Chun-Wei Lo
Also filed as: LO CHUN-WEI
8 granted patents·1 pending application·18 citations·filing 2004–2022
79Inventor score
Top patents by PatentIndex Score
9 records- 0188US11507020B2Optical measurement system for obtaining and analyzing surface topography of objectIND TECH RES INST·Filed 2020·Granted Nov 22, 2022·2 cites·18 claims
- 0279US9752866B2Measurement systemIND TECH RES INST·Filed 2015·Granted Sep 5, 2017·4 cites·14 claims
- 0367US12270638B2Measurement system and measurement methodIND TECH RES INST·Filed 2022·Granted Apr 8, 2025·0 cites·12 claims
- 0461US12007221B2Heterogeneous integration detecting method and heterogeneous integration detecting apparatusIND TECH RES INST·Filed 2021·Granted Jun 11, 2024·0 cites·10 claims
- 0558US12099053B2Method of training AI for label-free cell viability determination and label-free cell viability determination method by trained AIIND TECH RES INST·Filed 2021·Granted Sep 24, 2024·0 cites·9 claims
- 0658US7096441B2Method for generating a command file of a group of DRC rules and/or a command file of a group of LVS/LPE rulesFARADAY TECH CORP·Filed 2004·Granted Aug 22, 2006·9 cites·15 claims
- 0752US7555737B2Auxiliary method for circuit designDORADO DESIGN AUTOMATION INC·Filed 2006·Granted Jun 30, 2009·3 cites·19 claims
- 0838US10094774B2Scattering measurement system and methodIND TECH RES INST·Filed 2016·Granted Oct 9, 2018·0 cites·2 claims
- 0933US2017045355A1Scattering measurement system and methodIND TECH RES INST·Filed 2015·Application pending·0 cites
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