Inventor · disambiguated record
James E. Hopkins
Also filed as: HOPKINS JAMES · HOPKINS JAMES E
15 granted patents·4 pending applications·131 citations·filing 1986–2023
90Inventor score
Files withCHROMA ATE INC10SEMICONDUCTOR TESTING ADVANCED2TELCO TESTING SYSTEMS LLC2CHRUMA ATE INC1DAVIS DANIEL E1
Top patents by PatentIndex Score
19 records- 0186US5563703ALead coplanarity inspection apparatus and method thereofMOTOROLA INC·Filed 1995·Granted Oct 8, 1996·65 cites·24 claims
- 0284US9954255B2Measurement fixture for a battery cellCHROMA ATE INC·Filed 2015·Granted Apr 24, 2018·2 cites·16 claims
- 0374US7388390B2Method for testing electronic componentsTELCO TESTING SYSTEMS LLC·Filed 2007·Granted Jun 17, 2008·9 cites·22 claims
- 0474US7262616B2Apparatus, method and system for testing electronic componentsTELCO TESTING SYSTEMS LLC·Filed 2006·Granted Aug 28, 2007·8 cites·31 claims
- 0573US4756533AMultiple jig-saw puzzle promotional lottery game and method of playing sameHOPKINS JAMES E·Filed 1986·Granted Jul 12, 1988·36 cites·12 claims
- 0667US7535214B2Apparatus for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted May 19, 2009·3 cites·22 claims
- 0756US2024228241A9Lifting systems and methods for performing operations on a structureDAVIS DANIEL E·Filed 2023·Application pending·0 cites
- 0855US10903618B2Fixture assembly for testing edge-emitting laser diodes and testing apparatus having the sameCHROMA ATE INC·Filed 2019·Granted Jan 26, 2021·0 cites·10 claims
- 0952US7518357B2Test circuits of an apparatus for testing micro SD devicesCHROMA ATE INC·Filed 2007·Granted Apr 14, 2009·2 cites·22 claims
- 1052US7518356B2Apparatus for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted Apr 14, 2009·2 cites·14 claims
- 1151US10965096B2Fixture assembly for testing surface emitting laser diodes and testing apparatus having the sameCHROMA ATE INC·Filed 2019·Granted Mar 30, 2021·0 cites·9 claims
- 1247US7545158B2Method for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted Jun 9, 2009·2 cites·20 claims
- 1346US7489156B2Method for testing micro SD devices using test circuitsCHRUMA ATE INC·Filed 2007·Granted Feb 10, 2009·2 cites·20 claims
- 1438US7514914B2Test circuits of an apparatus for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted Apr 7, 2009·0 cites·22 claims
- 1537US7489155B2Method for testing plurality of system-in-package devices using plurality of test circuitsCHROMA ATE INC·Filed 2007·Granted Feb 10, 2009·0 cites·20 claims
- 1637US7443190B1Method for testing micro SD devices using each test circuitsCHROMA ATE INC·Filed 2007·Granted Oct 28, 2008·0 cites·20 claims
- 1735US2008252321A1Apparatus for testing micro SD devicesSEMICONDUCTOR TESTING ADVANCED·Filed 2007·Application pending·0 cites
- 1835US2008252317A1Apparatus for testing system-in-package devicesSEMICONDUCTOR TESTING ADVANCED·Filed 2007·Application pending·0 cites
- 1930US2008238639A1Automobile auxiliary light testing deviceHOPKINS JAMES·Filed 2007·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →