Inventor · disambiguated record
Shawn T. Walsh
Also filed as: WALSH SHAWN · WALSH SHAWN T
10 granted patents·1 pending application·116 citations·filing 1986–2011
88Inventor score
Top patents by PatentIndex Score
11 records- 0182US6908800B1Tunable sidewall spacer process for CMOS integrated circuitsTEXAS INSTRUMENTS INC·Filed 2000·Granted Jun 21, 2005·32 cites·7 claims
- 0271US6107147AStacked poly/amorphous silicon gate giving low sheet resistance silicide film at submicron linewidthsTEXAS INSTRUMENTS INC·Filed 1999·Granted Aug 22, 2000·32 cites·13 claims
- 0362US8669757B2Fibre monitoring apparatus and methodINKPEN STUART·Filed 2011·Granted Mar 11, 2014·2 cites·5 claims
- 0456US4714949AElectrostatic discharge protection using thin nickel fuseTEXAS INSTRUMENTS INC·Filed 1986·Granted Dec 22, 1987·22 cites·12 claims
- 0549US6686283B1Shallow trench isolation planarization using self aligned isotropic etchTEXAS INSTRUMENTS INC·Filed 2000·Granted Feb 3, 2004·4 cites·34 claims
- 0646US7927987B2Method of reducing channeling of ion implants using a sacrificial scattering layerTEXAS INSTRUMENTS INC·Filed 2007·Granted Apr 19, 2011·0 cites·6 claims
- 0741US7983785B2Fibre monitoring apparatus and methodINSTRUMAR LTD·Filed 2004·Granted Jul 19, 2011·1 cites·16 claims
- 0840US6228741B1Method for trench isolation of semiconductor devicesTEXAS INSTRUMENTS INC·Filed 1999·Granted May 8, 2001·10 cites·18 claims
- 0939US4801558AElectrostatic discharge protection using thin nickel fuseTEXAS INSTRUMENTS INC·Filed 1987·Granted Jan 31, 1989·9 cites·18 claims
- 1037US2005164443A1Tunable sidewall spacer process for CMOS integrated circuitsFiled 2005·Application pending·0 cites
- 1131US5095216AMethod of fabricating infrared detectors and the detectorTEXAS INSTRUMENTS INC·Filed 1990·Granted Mar 10, 1992·4 cites·16 claims
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