Inventor · disambiguated record
Tom Waayers
Also filed as: WAAYERS TOM
10 granted patents·57 citations·filing 2005–2019
86Inventor score
Top patents by PatentIndex Score
10 records- 0189US10571518B1Limited pin test interface with analog test busNXP BV·Filed 2018·Granted Feb 25, 2020·15 cites·19 claims
- 0287US7941717B2IC testing methods and apparatusNXP BV·Filed 2006·Granted May 10, 2011·18 cites·22 claims
- 0368US8327205B2IC testing methods and apparatusWAAYERS TOM·Filed 2007·Granted Dec 4, 2012·9 cites·19 claims
- 0468US7870449B2IC testing methods and apparatusNXP BV·Filed 2006·Granted Jan 11, 2011·6 cites·22 claims
- 0565US7945834B2IC testing methods and apparatusNXP BV·Filed 2006·Granted May 17, 2011·6 cites·21 claims
- 0658US7941719B2IC testing methods and apparatusNXP BV·Filed 2006·Granted May 10, 2011·3 cites·15 claims
- 0749US9465072B2Method and system for digital circuit scan testingNXP BV·Filed 2015·Granted Oct 11, 2016·0 cites·18 claims
- 0846US11301607B2Testing of asynchronous reset logicNXP BV·Filed 2019·Granted Apr 12, 2022·0 cites·20 claims
- 0942US10162000B2Testing an integrated circuit device with multiple testing protocolsWAAYERS TOM·Filed 2012·Granted Dec 25, 2018·0 cites·13 claims
- 1036US7685488B2Circuit interconnect testing arrangement and approach thereforNXP BV·Filed 2005·Granted Mar 23, 2010·0 cites·11 claims
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