Inventor · disambiguated record

Sudeep Kumar Lahiri

Also filed as: LAHIRI SUDEEP KUMAR

2 granted patents·25 citations·filing 2008–2012

55Inventor score

Technology areasH10P

Files withLAHIRI SUDEEP KUMAR2

Top patents by PatentIndex Score

2 records

0187US8106651B2Methods and apparatuses for determining thickness of a conductive layerLAHIRI SUDEEP KUMAR·Filed 2008·Granted Jan 31, 2012·25 cites·32 claims
0245US9007059B2Methods for monitoring thickness of a conductive layerLAHIRI SUDEEP KUMAR·Filed 2012·Granted Apr 14, 2015·0 cites·27 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →