Inventor · disambiguated record
Yoshito Konno
Also filed as: KONNO YOSHITO
9 granted patents·79 citations·filing 2000–2013
85Inventor score
Top patents by PatentIndex Score
9 records- 0189US6563330B1Probe card and method of testing wafer having a plurality of semiconductor devicesFUJITSU LTD·Filed 2000·Granted May 13, 2003·37 cites·18 claims
- 0278US8991464B2Method and apparatus for peeling electronic componentKONNO YOSHITO·Filed 2012·Granted Mar 31, 2015·4 cites·11 claims
- 0378US6461942B2Semiconductor chip removing and conveying method and deviceFUJITSU LTD·Filed 2000·Granted Oct 8, 2002·24 cites·3 claims
- 0473US9508559B2Semiconductor wafer and method for manufacturing semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2013·Granted Nov 29, 2016·4 cites·11 claims
- 0570US8828186B2Method and apparatus for peeling electronic componentKONNO YOSHITO·Filed 2009·Granted Sep 9, 2014·3 cites·10 claims
- 0661US6774650B2Probe card and method of testing wafer having a plurality of semiconductor devicesFUJITSU LTD·Filed 2003·Granted Aug 10, 2004·7 cites·3 claims
- 0739US8445906B2Method for sorting and acquiring semiconductor element, method for producing semiconductor device, and semiconductor deviceKONNO YOSHITO·Filed 2010·Granted May 21, 2013·0 cites·8 claims
- 0839US8349624B2Method for fabricating semiconductor deviceFUJITSU SEMICONDUCTOR LTD·Filed 2010·Granted Jan 8, 2013·0 cites·8 claims
- 0926US6930566B2Small nonreciprocal circuit element that can be easily wiredALPS ELECTRIC CO LTD·Filed 2003·Granted Aug 16, 2005·0 cites·10 claims
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