Inventor · disambiguated record
Michael Cullinan
Also filed as: CULLINAN MICHAEL · CULLINAN MICHAEL A
8 granted patents·5 pending applications·2 citations·filing 2016–2025
75Inventor score
Top patents by PatentIndex Score
13 records- 0190US2025385120A1Heterogeneous integration of components onto compact devices using moiré based metrology and vacuum based pick-and-placeUNIV TEXAS·Filed 2025·Application pending·0 cites
- 0290US2025385121A1Heterogeneous integration of components onto compact devices using moiré based metrology and vacuum based pick-and-placeUNIV TEXAS·Filed 2025·Application pending·0 cites
- 0385US12308275B2Heterogeneous integration of components onto compact devices using moiré based metrology and vacuum based pick-and-placeUNIV TEXAS·Filed 2024·Granted May 20, 2025·0 cites·10 claims
- 0483US2025285904A1Heterogeneous integration of components onto compact devices using moiré based metrology and vacuum based pick-and-placeUNIV TEXAS·Filed 2025·Application pending·0 cites
- 0582US10722947B2Micro-selective sintering laser systems and methods thereofUNIV TEXAS·Filed 2017·Granted Jul 28, 2020·2 cites·31 claims
- 0678US12009247B2Heterogeneous integration of components onto compact devices using moiré based metrology and vacuum based pick-and-placeUNIV TEXAS·Filed 2022·Granted Jun 11, 2024·0 cites·37 claims
- 0760US11469131B2Heterogeneous integration of components onto compact devices using moire based metrology and vacuum based pick-and-placeUNIV TEXAS·Filed 2017·Granted Oct 11, 2022·0 cites·23 claims
- 0847US11228294B2Graphene microelectromechanical system (MEMS) resonant gas sensorUNIV TEXAS·Filed 2018·Granted Jan 18, 2022·0 cites·5 claims
- 0945US10649003B2Coupled multiscale positioning of arrays of parallel, independently actuated and simultaneously driven modular scanning probe microscopes for high-throughput, in-line, nanoscale measurement of flexible, large area, and roll-to-roll processesUNIV TEXAS·Filed 2018·Granted May 12, 2020·0 cites·28 claims
- 1043US10712364B2Metrology devices for rapid specimen setupUNIV TEXAS·Filed 2016·Granted Jul 14, 2020·0 cites·21 claims
- 1136US10451539B2Microscale sensors for direct metrology of additively manufactured featuresSAHA SOURABH·Filed 2018·Granted Oct 22, 2019·0 cites·22 claims
- 1234US2018323096A1Systems and methods for passive alignment of semiconductor wafersUNIV TEXAS·Filed 2016·Application pending·0 cites
- 1324US2018321276A1Metrology devices and methods for independently controlling a plurality of sensing probesUNIV TEXAS·Filed 2016·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →