Inventor · disambiguated record
Devin M. Batutis
Also filed as: BATUTIS DEVIN · BATUTIS DEVIN M
29 granted patents·4 pending applications·99 citations·filing 2001–2025
95Inventor score
Files withMICRON TECHNOLOGY INC33
Top patents by PatentIndex Score
33 records- 0197US11437108B1Voltage bin calibration based on a temporary voltage shift offsetMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 6, 2022·5 cites·20 claims
- 0295US11783901B2Multi-tier threshold voltage offset bin calibrationMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 10, 2023·3 cites·20 claims
- 0395US11709727B2Managing error-handling flows in memory devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 25, 2023·3 cites·19 claims
- 0495US11017870B1Select gate maintenance in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2020·Granted May 25, 2021·7 cites·20 claims
- 0594US11360677B2Selective partitioning of sets of pages programmed to memory deviceMICRON TECHNOLOGY INC·Filed 2020·Granted Jun 14, 2022·3 cites·15 claims
- 0692US10387281B2Flash memory block retirement policyMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 20, 2019·10 cites·20 claims
- 0790US11587639B2Voltage calibration scans to reduce memory device overheadMICRON TECHNOLOGY INC·Filed 2021·Granted Feb 21, 2023·2 cites·20 claims
- 0890US10325670B2Erase page checkMICRON TECHNOLOGY INC·Filed 2018·Granted Jun 18, 2019·5 cites·20 claims
- 0989US11609846B2Managing workload of programming sets of pages to memory deviceMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 21, 2023·2 cites·19 claims
- 1089US10096380B1Erase page checkMICRON TECHNOLOGY INC·Filed 2017·Granted Oct 9, 2018·7 cites·21 claims
- 1188US11450391B2Multi-tier threshold voltage offset bin calibrationMICRON TECHNOLOGY INC·Filed 2020·Granted Sep 20, 2022·2 cites·19 claims
- 1288US6684173B2System and method of testing non-volatile memory cellsMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 27, 2004·49 cites·23 claims
- 1382US12393363B2Voltage bin calibration based on a voltage distribution reference voltageMICRON TECHNOLOGY INC·Filed 2024·Granted Aug 19, 2025·0 cites·20 claims
- 1477US11966616B2Voltage bin calibration based on a voltage distribution reference voltageMICRON TECHNOLOGY INC·Filed 2023·Granted Apr 23, 2024·0 cites·20 claims
- 1576US12229000B2Managing error-handling flows in memory devicesMICRON TECHNOLOGY INC·Filed 2023·Granted Feb 18, 2025·0 cites·20 claims
- 1675US10824527B2Flash memory block retirement policyMICRON TECHNOLOGY INC·Filed 2019·Granted Nov 3, 2020·1 cites·20 claims
- 1774US11886336B2Managing workload of programming sets of pages to memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Jan 30, 2024·0 cites·20 claims
- 1874US2025013370A1Memory operation based on block-associated temperatureMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1973US2025022523A1Dynamic prioritization of selector vt scansMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 2070US11823748B2Voltage bin calibration based on a temporary voltage shift offsetMICRON TECHNOLOGY INC·Filed 2022·Granted Nov 21, 2023·0 cites·20 claims
- 2169US12106813B2Dynamic prioritization of selector VT scansMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 1, 2024·0 cites·19 claims
- 2269US12057185B2Voltage calibration scans to reduce memory device overheadMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 6, 2024·0 cites·20 claims
- 2369US11837307B2Managing error-handling flows in memory devicesMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 5, 2023·0 cites·20 claims
- 2469US11620074B2Voltage bin calibration based on a voltage distribution reference voltageMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 4, 2023·0 cites·20 claims
- 2568US12124705B2Memory operation based on block-associated temperatureMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 22, 2024·0 cites·20 claims
- 2667US11288149B2Flash memory block retirement policyMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 29, 2022·0 cites·19 claims
- 2766US11995326B2Selective partitioning of sets of pages programmed to memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted May 28, 2024·0 cites·20 claims
- 2864US10685731B2Erase page checkMICRON TECHNOLOGY INC·Filed 2019·Granted Jun 16, 2020·0 cites·20 claims
- 2963US11532373B2Managing error-handling flows in memory devicesMICRON TECHNOLOGY INC·Filed 2021·Granted Dec 20, 2022·0 cites·20 claims
- 3063US11456043B2Select gate maintenance in a memory sub-systemMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 27, 2022·0 cites·20 claims
- 3162US2025342900A1Virtual block multi-plan access systemMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3256US2025239311A1Memory device coarse threshold estimate read under multi-plane modeMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3353US11501840B1Proximity disturb remediation based on a number of programmed memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted Nov 15, 2022·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →