Inventor · disambiguated record
Shahar Gov
Also filed as: GOV SHAHAR
8 granted patents·3 pending applications·44 citations·filing 2003–2022
80Inventor score
Top patents by PatentIndex Score
11 records- 0183US11946875B2Optical phase measurement system and methodNOVA LTD·Filed 2022·Granted Apr 2, 2024·0 cites·20 claims
- 0282US6815947B2Method and system for thickness measurements of thin conductive layersNOVA MEASURING INSTR LTD·Filed 2003·Granted Nov 9, 2004·42 cites·41 claims
- 0381US10365231B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2018·Granted Jul 30, 2019·1 cites·17 claims
- 0475US9897553B2Optical phase measurement method and systemNOVA MEASURING INSTR LTD·Filed 2014·Granted Feb 20, 2018·1 cites·20 claims
- 0569US11460415B2Optical phase measurement system and methodNOVA LTD·Filed 2020·Granted Oct 4, 2022·0 cites·18 claims
- 0665US10663408B2Optical phase measurement system and methodNOVA MEASURING INSTR LTD·Filed 2019·Granted May 26, 2020·0 cites·20 claims
- 0755US2008158553A1Optical measurements of patterned articlesNOVA MEASURING INSTR LTD·Filed 2008·Application pending·0 cites
- 0852US7330259B2Optical measurements of patterned articlesNOVA MEASURING INSTR LTD·Filed 2004·Granted Feb 12, 2008·0 cites·37 claims
- 0947US2024068964A1Evaluating x-ray signals from a perturbed objectNOVA LTD·Filed 2021·Application pending·0 cites
- 1036US2008018991A1Glan-Thompson Type Broadband Polarizer Device for Use in the Deep Ultraviolet Spectral Range and Method of Its ManufactureWINIK MICHAEL·Filed 2004·Application pending·0 cites
- 1131US11512943B2Optical system and method for measuring parameters of patterned structures in micro-electronic devicesNOVA LTD·Filed 2016·Granted Nov 29, 2022·0 cites·6 claims
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