Inventor · disambiguated record
Randall G. Percival
Also filed as: PERCIVAL RANDALL · PERCIVAL RANDALL G
28 granted patents·1 pending application·904 citations·filing 1990–2015
97Inventor score
Top patents by PatentIndex Score
29 records- 0199US7557359B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·71 cites·112 claims
- 0299US7554096B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jun 30, 2009·100 cites·66 claims
- 0398US7786452B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Aug 31, 2010·61 cites·77 claims
- 0498US7557358B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·69 cites·71 claims
- 0598US7557360B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·67 cites·28 claims
- 0698US7557361B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·67 cites·110 claims
- 0798US7554097B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jun 30, 2009·74 cites·82 claims
- 0897US7786451B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Aug 31, 2010·58 cites·120 claims
- 0996US8110814B2Ion sources, systems and methodsWARD BILLY W·Filed 2009·Granted Feb 7, 2012·33 cites·20 claims
- 1095US7511280B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Mar 31, 2009·26 cites·9 claims
- 1195US7511279B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Mar 31, 2009·29 cites·112 claims
- 1295US7504639B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Mar 17, 2009·24 cites·31 claims
- 1394US7488952B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Feb 10, 2009·20 cites·23 claims
- 1494US7485873B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Feb 3, 2009·36 cites·25 claims
- 1593US7521693B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Apr 21, 2009·23 cites·107 claims
- 1693US7495232B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Feb 24, 2009·20 cites·25 claims
- 1792US7601953B2Systems and methods for a gas field ion microscopeALIS CORP·Filed 2006·Granted Oct 13, 2009·16 cites·19 claims
- 1891US5034612AIon source method and apparatusMICRION CORP·Filed 1990·Granted Jul 23, 1991·72 cites·15 claims
- 1990US7518122B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Apr 14, 2009·19 cites·10 claims
- 2089US9236225B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted Jan 12, 2016·4 cites·23 claims
- 2176US8748845B2Ion sources, systems and methodsWARD BILLY W·Filed 2012·Granted Jun 10, 2014·2 cites·28 claims
- 2276US8461557B2Ion sources, systems and methodsCOMUNALE RICHARD·Filed 2008·Granted Jun 11, 2013·5 cites·16 claims
- 2372US8558192B2Gas delivery system with voltage gradient for an ion microscopeWARD BILLY W·Filed 2011·Granted Oct 15, 2013·2 cites·22 claims
- 2471US9159527B2Systems and methods for a gas field ionization sourceWARD BILLY W·Filed 2008·Granted Oct 13, 2015·3 cites·36 claims
- 2571US9012867B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Apr 21, 2015·1 cites·20 claims
- 2666US8124941B2Increasing current in charged particle sources and systemsNOTTE IV JOHN A·Filed 2009·Granted Feb 28, 2012·2 cites·27 claims
- 2757US9029765B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2013·Granted May 12, 2015·0 cites·21 claims
- 2843US2007228287A1Systems and methods for a gas field ionization sourceALIS TECHNOLOGY CORP·Filed 2006·Application pending·0 cites
- 2936US8993981B2Charged particle source with light monitoring for tip temperature determinationNOTTE IV JOHN·Filed 2011·Granted Mar 31, 2015·0 cites·17 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →