Inventor · disambiguated record
Warren K. Harwood
Also filed as: HARWOOD WARREN K
27 granted patents·1,722 citations·filing 1988–2015
98Inventor score
Top patents by PatentIndex Score
27 records- 0197US7009383B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2004·Granted Mar 7, 2006·113 cites·8 claims
- 0297US6335628B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Jan 1, 2002·102 cites·5 claims
- 0396US6492822B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2001·Granted Dec 10, 2002·64 cites·8 claims
- 0496US5457398AWafer probe station having full guardingCASCADE MICROTECH INC·Filed 1993·Granted Oct 10, 1995·149 cites·22 claims
- 0596US5345170AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1992·Granted Sep 6, 1994·166 cites·7 claims
- 0695US6720782B2Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 2002·Granted Apr 13, 2004·53 cites·8 claims
- 0795US6636059B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2002·Granted Oct 21, 2003·57 cites·15 claims
- 0895US6486687B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2002·Granted Nov 26, 2002·59 cites·7 claims
- 0995US5604444AWafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 1996·Granted Feb 18, 1997·107 cites·9 claims
- 1094US6801047B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2003·Granted Oct 5, 2004·51 cites·9 claims
- 1194US6380751B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2001·Granted Apr 30, 2002·54 cites·22 claims
- 1294US6232788B1Wafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 1997·Granted May 15, 2001·98 cites·8 claims
- 1394US5663653AWafer probe station for low-current measurementsCASCADE MICROTECH INC·Filed 1995·Granted Sep 2, 1997·91 cites·15 claims
- 1494US5532609AWafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 1995·Granted Jul 2, 1996·89 cites·10 claims
- 1593US5266889AWafer probe station with integrated environment control enclosureCASCADE MICROTECH INC·Filed 1992·Granted Nov 30, 1993·172 cites·6 claims
- 1692US7589518B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2005·Granted Sep 15, 2009·10 cites·5 claims
- 1791US7492147B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2007·Granted Feb 17, 2009·8 cites·10 claims
- 1891US7348787B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2005·Granted Mar 25, 2008·11 cites·8 claims
- 1991US7330023B2Wafer probe station having a skirting componentCASCADE MICROTECH INC·Filed 2005·Granted Feb 12, 2008·9 cites·4 claims
- 2090US7595632B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 2008·Granted Sep 29, 2009·9 cites·9 claims
- 2190US5434512AWafer probe station having integrated guarding, Kelvin connection and shielding systemsCASCADE MICROTECH INC·Filed 1994·Granted Jul 18, 1995·73 cites·2 claims
- 2286US5237267AWafer probe station having auxiliary chucksCASCADE MICROTECH INC·Filed 1992·Granted Aug 17, 1993·60 cites·13 claims
- 2384US6313649B2Wafer probe station having environment control enclosureCASCADE MICROTECH INC·Filed 1997·Granted Nov 6, 2001·71 cites·7 claims
- 2470US4855697ACoaxial transmission line to microstrip transmission line launcherCASCADE MICROTECH INC·Filed 1988·Granted Aug 8, 1989·19 cites·8 claims
- 2567US4961050ATest fixture for microstrip assembliesCASCADE MICROTECH INC·Filed 1989·Granted Oct 2, 1990·23 cites·36 claims
- 2661US6980012B2Wafer probe station for low-current measurementsCASCASE MICROTECH INC·Filed 2003·Granted Dec 27, 2005·4 cites·8 claims
- 2736US11225091B2Print media pressure platesHEWLETT PACKARD DEVELOPMENT CO·Filed 2015·Granted Jan 18, 2022·0 cites·16 claims
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