Inventor · disambiguated record
Hidenori Shibata
Also filed as: SHIBATA HIDENORI
27 granted patents·3 pending applications·571 citations·filing 1981–2012
97Inventor score
Files withTOSHIBA KK15MATSUSHITA ELECTRIC INDUSTRIAL CO LTD8ASAHI GLASS CO LTD3MUKAI KIYOHITO1PANASONIC CORP1
Top patents by PatentIndex Score
30 records- 0194US6690423B1Solid-state image pickup apparatusTOSHIBA KK·Filed 1999·Granted Feb 10, 2004·142 cites·21 claims
- 0286US7224003B2Solid-state image pickup apparatusTOSHIBA KK·Filed 2006·Granted May 29, 2007·8 cites·9 claims
- 0382US6335220B1Solid state imaging device with four-phase charge-coupled device and method of manufacturing the sameTOSHIBA KK·Filed 2000·Granted Jan 1, 2002·29 cites·4 claims
- 0480US6168891B1Method for correcting mask pattern for use in manufacturing of semiconductor integrated circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Jan 2, 2001·44 cites·18 claims
- 0580US5970238AMethod and apparatus for generating planarizing pattern and semiconductor integrated circuit deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Oct 19, 1999·65 cites·23 claims
- 0679US7042061B2Solid-state image pickup apparatusTOSHIBA KK·Filed 2003·Granted May 9, 2006·20 cites·10 claims
- 0776US6710449B2Interconnection structure and method for designing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Mar 23, 2004·25 cites·7 claims
- 0875US6303251B1Mask pattern correction process, photomask and semiconductor integrated circuit deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Oct 16, 2001·37 cites·12 claims
- 0975US4972254ASolid state image sensors for reproducing high definition imagesTOSHIBA KK·Filed 1988·Granted Nov 20, 1990·25 cites·19 claims
- 1067US4688098ASolid state image sensor with means for removing excess photochargesTOSHIBA KK·Filed 1985·Granted Aug 18, 1987·26 cites·14 claims
- 1164US5731601AFour-phase driving CCD solid-state imaging device with a two-layer transfer gate electrodeTOSHIBA KK·Filed 1996·Granted Mar 24, 1998·23 cites·9 claims
- 1264US4987466ASolid state image sensorTOSHIBA KK·Filed 1989·Granted Jan 22, 1991·20 cites·24 claims
- 1363US5986292ASemiconductor integrated logic circuit deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1997·Granted Nov 16, 1999·24 cites·14 claims
- 1460US5446493ASolid state image sensors for reproducing high definition imagesTOSHIBA KK·Filed 1994·Granted Aug 29, 1995·16 cites·14 claims
- 1553US6943129B2Interconnection structure and method for designing the sameMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2003·Granted Sep 13, 2005·6 cites·6 claims
- 1651US5221452AMonopolar ion exchange membrane electrolytic cell assemblyASAHI GLASS CO LTD·Filed 1991·Granted Jun 22, 1993·10 cites·17 claims
- 1751US5063449ASolid-state image sensor employing a gate and diode for bias charge injectionTOSHIBA KK·Filed 1989·Granted Nov 5, 1991·11 cites·15 claims
- 1850US2007136702A1Semiconductor device layout inspection methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2007·Application pending·0 cites
- 1946US6444570B2Method of manufacturing a multi-layered wiring structure for interconnecting semiconductor devices by patterning resist and antireflective films to define wiring groovesTOSHIBA KK·Filed 2001·Granted Sep 3, 2002·2 cites·12 claims
- 2046US2004139407A1Semiconductor device layout inspection methodMUKAI KIYOHITO·Filed 2003·Application pending·0 cites
- 2145US5637894ASolid state image sensor device with single-layered transfer electrodesTOSHIBA KK·Filed 1995·Granted Jun 10, 1997·12 cites·3 claims
- 2245US4333804AMethod of preventing deterioration of palladium oxide anodeASAHI GLASS CO LTD·Filed 1981·Granted Jun 8, 1982·6 cites·9 claims
- 2344US2007262454A1Semiconductor device and wiring auxiliary pattern generating methodSHIBATA HIDENORI·Filed 2007·Application pending·0 cites
- 2443US7214595B2Method of producing semiconductor devicesTOSHIBA KK·Filed 2003·Granted May 8, 2007·1 cites·4 claims
- 2541US9305863B2Semiconductor devicePANASONIC CORP·Filed 2012·Granted Apr 5, 2016·0 cites·22 claims
- 2640US5254233AMonopolar ion exchange membrane electrolytic cell assemblyASAHI GLASS CO LTD·Filed 1992·Granted Oct 19, 1993·6 cites·20 claims
- 2738US6028629ASolid-state imaging device and method of manufacturing the sameTOSHIBA KK·Filed 1997·Granted Feb 22, 2000·6 cites·4 claims
- 2836US6183920B1Semiconductor device geometrical pattern correction process and geometrical pattern extraction processMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1999·Granted Feb 6, 2001·4 cites·21 claims
- 2933US8552550B2Semiconductor deviceSHIMADA JUNICHI·Filed 2012·Granted Oct 8, 2013·0 cites·11 claims
- 3033US6207982B1Solid-state image pickup device capable of high-speed transfer of signal charges in horizontal directionTOSHIBA KK·Filed 1998·Granted Mar 27, 2001·3 cites·10 claims
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