Inventor · disambiguated record
Kie-Bong Ku
Also filed as: KU KIE BONG
46 granted patents·2 pending applications·566 citations·filing 1999–2018
98Inventor score
Files withSK HYNIX INC19HYNIX SEMICONDUCTOR INC11HYUNDAI ELECTRONICS IND9KU KIE BONG8HYUNDAI ELECTRONICS IND LTD1
Top patents by PatentIndex Score
48 records- 0199US8811100B2Cell array and memory device including the sameSK HYNIX INC·Filed 2012·Granted Aug 19, 2014·84 cites·10 claims
- 0295US7463534B2Write apparatus for DDR SDRAM semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Dec 9, 2008·44 cites·13 claims
- 0395US6396322B1Delay locked loop of a DDR SDRAMHYUNDAI ELECTRONICS IND·Filed 2001·Granted May 28, 2002·92 cites·8 claims
- 0489US9104571B2Monitoring device of integrated circuitKU KIE-BONG·Filed 2011·Granted Aug 11, 2015·10 cites·6 claims
- 0586US6141273ACircuit for setting width of input/output data in semiconductor memory deviceHYUNDAI ELECTRONICS IND·Filed 1999·Granted Oct 31, 2000·61 cites·20 claims
- 0684US9231580B2Semicondutor apparatus for controlling back biasSK HYNIX INC·Filed 2014·Granted Jan 5, 2016·6 cites·17 claims
- 0784US8237486B2Clock control circuit and semiconductor memory apparatus using the sameKU KIE BONG·Filed 2010·Granted Aug 7, 2012·9 cites·17 claims
- 0882US8824228B2Integrated circuit chip and memory deviceSK HYNIX INC·Filed 2012·Granted Sep 2, 2014·4 cites·12 claims
- 0979US7548100B2Delay locked loopHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jun 16, 2009·8 cites·9 claims
- 1078US7671646B2Delay locked loopHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Mar 2, 2010·9 cites·11 claims
- 1175US8456937B2Semiconductor integrated circuitKU KIE BONG·Filed 2011·Granted Jun 4, 2013·5 cites·14 claims
- 1273US9450587B2Test circuit and test method of semiconductor apparatusSK HYNIX INC·Filed 2014·Granted Sep 20, 2016·2 cites·20 claims
- 1372US6285603B1Repair circuit of semiconductor memory deviceHYUNDAI ELECTRONICS IND LTD·Filed 1999·Granted Sep 4, 2001·32 cites·19 claims
- 1472US6150868AAnti-fuse programming circuitHYUNDAI ELECTRONICS IND·Filed 1999·Granted Nov 21, 2000·41 cites·7 claims
- 1572US6108261ARepair circuit for redundancy circuit with anti-fuseHYUNDAI ELECTRONICS IND·Filed 1999·Granted Aug 22, 2000·30 cites·11 claims
- 1671US9287855B2Semiconductor device and semiconductor system including the sameSK HYNIX INC·Filed 2013·Granted Mar 15, 2016·3 cites·12 claims
- 1769US10037291B2Semiconductor memory apparatus and data input/output method thereofSK HYNIX INC·Filed 2015·Granted Jul 31, 2018·2 cites·14 claims
- 1869US9448866B2Monitoring device of integrated circuitSK HYNIX INC·Filed 2015·Granted Sep 20, 2016·1 cites·3 claims
- 1969US6255895B1Circuit for generating a reference voltage trimmed by an anti-fuse programmingHYUNDAI ELECTRONICS IND·Filed 1999·Granted Jul 3, 2001·22 cites·13 claims
- 2067US8817573B2Semiconductor memory device including mode register set and method for operating the sameKU KIE-BONG·Filed 2011·Granted Aug 26, 2014·3 cites·24 claims
- 2166US9070428B2Semiconductor deviceSK HYNIX INC·Filed 2013·Granted Jun 30, 2015·3 cites·14 claims
- 2265US9275700B2Semiconductor deviceSK HYNIX INC·Filed 2013·Granted Mar 1, 2016·3 cites·12 claims
- 2364US7626873B2Semiconductor memory apparatus, semiconductor integrated circuit having the same, and method of outputting data in semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Dec 1, 2009·5 cites·12 claims
- 2462US7916562B2Clock driver device and semiconductor memory apparatus having the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Mar 29, 2011·4 cites·23 claims
- 2561US6144247AAnti-fuse programming circuit using variable voltage generatorHYUNDAI ELECTRONICS IND·Filed 1999·Granted Nov 7, 2000·20 cites·10 claims
- 2660US6133778AAnti-fuse programming circuit with cross-coupled feedback loopHYUNDAI ELECTRONICS IND·Filed 1999·Granted Oct 17, 2000·19 cites·9 claims
- 2758US8243533B2Semiconductor memory device and method of operating the sameKU KIE-BONG·Filed 2009·Granted Aug 14, 2012·3 cites·13 claims
- 2858US6356501B2Apparatus for generating high voltage signalHYUNDAI ELECTRONICS IND·Filed 2000·Granted Mar 12, 2002·15 cites·19 claims
- 2957US7679969B2Semiconductor memory device utilizing data mask signal for sharing an input/output channel in a test mode and data output method using the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Mar 16, 2010·3 cites·24 claims
- 3056US9324400B2Semiconductor memory device and semiconductor memory systemSK HYNIX INC·Filed 2014·Granted Apr 26, 2016·1 cites·14 claims
- 3155US6920068B2Semiconductor memory device with modified global input/output schemeHYNIX SEMICONDUCTOR INC·Filed 2003·Granted Jul 19, 2005·8 cites·9 claims
- 3254US9396079B2Semiconductor memory device and semiconductor system including the sameSK HYNIX INC·Filed 2013·Granted Jul 19, 2016·1 cites·19 claims
- 3354US9274162B2Method and system for testing semiconductor deviceSK HYNIX INC·Filed 2014·Granted Mar 1, 2016·0 cites·6 claims
- 3453US8922235B2Method and system for testing semiconductor deviceKU KIE-BONG·Filed 2011·Granted Dec 30, 2014·1 cites·10 claims
- 3551US9489992B2Semiconductor device and semiconductor system including the sameSK HYNIX INC·Filed 2016·Granted Nov 8, 2016·0 cites·4 claims
- 3650US10409741B2Semiconductor memory apparatus and data input/output method thereofSK HYNIX INC·Filed 2018·Granted Sep 10, 2019·0 cites·17 claims
- 3749US6519199B2Semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Feb 11, 2003·6 cites·19 claims
- 3847US9401224B2Monitoring device of integrated circuitSK HYNIX INC·Filed 2015·Granted Jul 26, 2016·0 cites·7 claims
- 3945US9285414B2Method and system for testing semiconductor deviceSK HYNIX INC·Filed 2014·Granted Mar 15, 2016·0 cites·4 claims
- 4044US7855570B2Semiconductor device for performing mount test in response to internal test mode signalsHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Dec 21, 2010·0 cites·20 claims
- 4141US9524760B2Data output circuitSK HYNIX INC·Filed 2015·Granted Dec 20, 2016·0 cites·20 claims
- 4240US9013931B2Semiconductor memory device and method for testing the sameSK HYNIX INC·Filed 2013·Granted Apr 21, 2015·0 cites·19 claims
- 4340US8437212B2Semiconductor memory apparatus, memory system, and programming method thereofKU KIE BONG·Filed 2010·Granted May 7, 2013·0 cites·17 claims
- 4440US8027210B2Data input apparatus with improved setup/hold windowHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Sep 27, 2011·0 cites·18 claims
- 4539US8520462B2Semiconductor memory apparatusKU KIE BONG·Filed 2011·Granted Aug 27, 2013·0 cites·11 claims
- 4639US6323720B1Internal voltage generator using anti-fuseHYUNDAI ELECTRONICS IND·Filed 1999·Granted Nov 27, 2001·6 cites·22 claims
- 4738US2009303809A1Circuit and method for terminating data line of semiconductor integrated circuitHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 4830US2013339641A1Integrated circuit chip and memory deviceSK HYNIX INC·Filed 2012·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →