Inventor · disambiguated record
Atsuko Shintani
Also filed as: SHINTANI ATSUKO
5 granted patents·0 citations·filing 2017–2020
58Inventor score
Top patents by PatentIndex Score
5 records- 0149US12237145B2Charged particle beam device and inspection deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 25, 2025·0 cites·17 claims
- 0249US11276551B2Inspection deviceHITACHI LTD·Filed 2020·Granted Mar 15, 2022·0 cites·15 claims
- 0347US11713963B2Pattern shape evaluation device, pattern shape evaluation system, and pattern shape evaluation methodHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 1, 2023·0 cites·16 claims
- 0446US11430106B2Image processing device, image processing method and charged particle microscopeHITACHI HIGH TECH CORP·Filed 2017·Granted Aug 30, 2022·0 cites·4 claims
- 0544US11380518B2Measurement system and method for setting observation conditions of measurement apparatusHITACHI LTD·Filed 2019·Granted Jul 5, 2022·0 cites·14 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →