Inventor · disambiguated record
Hung-Der Su
Also filed as: SU HUNG-DE · SU HUNG-DER
59 granted patents·14 pending applications·1,316 citations·filing 1997–2022
99Inventor score
Files withTAIWAN SEMICONDUCTOR MFG27RICHTEK TECHNOLOGY CORP19HUANG TSUNG-YI5SU HUNG-DER4YANG CHING YAO4
Top patents by PatentIndex Score
73 records- 0196US6074915AMethod of making embedded flash memory with salicide and sac structureTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Jun 13, 2000·146 cites·47 claims
- 0296US6028324ATest structures for monitoring gate oxide defect densities and the plasma antenna effectTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Feb 22, 2000·191 cites·27 claims
- 0394US7132717B2Power metal oxide semiconductor transistor layout with lower output resistance and high current limitRICHTEK TECHNOLOGY CORP·Filed 2005·Granted Nov 7, 2006·34 cites·14 claims
- 0492US6133096AProcess for simultaneously fabricating a stack gate flash memory cell and salicided periphereral devicesFiled 1998·Granted Oct 17, 2000·97 cites·29 claims
- 0591US6127227AThin ONO thickness control and gradual gate oxidation suppression by b. N.su2 treatment in flash memoryTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Oct 3, 2000·97 cites·36 claims
- 0690US7436640B2Booster power management integrated circuit chip with ESD protection between output pads thereofRICHTEK TECHNOLOGY CORP·Filed 2005·Granted Oct 14, 2008·39 cites·9 claims
- 0789US6037223AStack gate flash memory cell featuring symmetric self aligned contact structuresTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Mar 14, 2000·68 cites·30 claims
- 0887US6444511B1CMOS output circuit with enhanced ESD protection using drain side implantationTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Sep 3, 2002·43 cites·12 claims
- 0987US6124177AMethod for making deep sub-micron mosfet structures having improved electrical characteristicsTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Sep 26, 2000·74 cites·28 claims
- 1086US6724036B1Stacked-gate flash memory cell with folding gate and increased coupling ratioTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Apr 20, 2004·40 cites·4 claims
- 1185US6153494AMethod to increase the coupling ratio of word line to floating gate by lateral coupling in stacked-gate flashTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Nov 28, 2000·70 cites·28 claims
- 1284US7728529B2LED driver using a depletion mode transistor to serve as a current sourceRICHTEK TECHNOLOGY CORP ROC·Filed 2005·Granted Jun 1, 2010·11 cites·10 claims
- 1383US7327124B2Control apparatus and method for a boost-inverting converterRICHTEK TECHNOLOGY CORP·Filed 2006·Granted Feb 5, 2008·19 cites·70 claims
- 1482US7382172B2Level shift circuit and method for the sameRICHTEK TECHNOLOGY CORP·Filed 2006·Granted Jun 3, 2008·11 cites·7 claims
- 1580US6261905B1Flash memory structure with stacking gate formed using damascene-like structureTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Jul 17, 2001·26 cites·22 claims
- 1679US7248084B2Method for determining switching state of a transistor-based switching deviceRICHTEK TECHNOLOGY CORP·Filed 2005·Granted Jul 24, 2007·11 cites·7 claims
- 1779US6885214B1Method for measuring capacitance-voltage curves for transistorsTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Apr 26, 2005·24 cites·32 claims
- 1878US7557553B2Power supply circuit and control method thereofRICHTEK TECHNOLOGY CORP·Filed 2007·Granted Jul 7, 2009·13 cites·38 claims
- 1976US6297098B1Tilt-angle ion implant to improve junction breakdown in flash memory applicationTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Oct 2, 2001·38 cites·14 claims
- 2076US6246075B1Test structures for monitoring gate oxide defect densities and the plasma antenna effectTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Jun 12, 2001·16 cites·3 claims
- 2175US6653709B2CMOS output circuit with enhanced ESD protection using drain side implantationTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Nov 25, 2003·19 cites·13 claims
- 2275US6582995B2Method for fabricating a shallow ion implanted microelectronic structureTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Jun 24, 2003·22 cites·11 claims
- 2375US6130168AUsing ONO as hard mask to reduce STI oxide loss on low voltage device in flash or EPROM processTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Oct 10, 2000·47 cites·20 claims
- 2475US6001687AProcess for forming self-aligned source in flash cell using SiN spacer as hard maskTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Dec 14, 1999·31 cites·17 claims
- 2570US6747857B1Clamping circuit for stacked NMOS ESD protectionTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Jun 8, 2004·15 cites·26 claims
- 2670US6414532B1Gate ground circuit approach for I/O ESD protectionTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Jul 2, 2002·16 cites·23 claims
- 2769US6348382B1Integration process to increase high voltage breakdown performanceTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Feb 19, 2002·29 cites·20 claims
- 2868US9287394B2Lateral double diffused metal oxide semiconductor device and manufacturing method thereofHUANG TSUNG-YI·Filed 2014·Granted Mar 15, 2016·2 cites·1 claims
- 2968US6765772B2Electrostatic discharge protection deviceTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Jul 20, 2004·14 cites·19 claims
- 3066US7839197B2Level shift circuitRICHTEK TECHNOLOGY CORP·Filed 2008·Granted Nov 23, 2010·5 cites·10 claims
- 3166US6251744B1Implant method to improve characteristics of high voltage isolation and high voltage breakdownTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Jun 26, 2001·32 cites·24 claims
- 3264US7838902B2Single-chip common-drain JFET device and its applicationsRICHTEK TECHNOLOGY CORP·Filed 2009·Granted Nov 23, 2010·1 cites·3 claims
- 3364US7535032B2Single-chip common-drain JFET device and its applicationsRICHTEK TECHNOLOGY CORP·Filed 2005·Granted May 19, 2009·1 cites·13 claims
- 3462US11243181B2Bio-detection device and manufacturing method thereofRICHTEK TECHNOLOGY CORP·Filed 2020·Granted Feb 8, 2022·0 cites·10 claims
- 3562US8928078B2Double diffused metal oxide semiconductor device and manufacturing method thereofKAO TZU-CHENG·Filed 2012·Granted Jan 6, 2015·2 cites·3 claims
- 3659US12396204B2FinFET with discontinuous channel regionsREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted Aug 19, 2025·0 cites·20 claims
- 3758US7795855B2Power management apparatus having an extended safe operation region and operation method thereofRICHTEK TECHNOLOGY CORP·Filed 2007·Granted Sep 14, 2010·4 cites·17 claims
- 3856US10591434B2Bio-detection device and manufacturing method thereofRICHTEK TECHNOLOGY CORP·Filed 2017·Granted Mar 17, 2020·0 cites·7 claims
- 3956US7838900B2Single-chip common-drain JFET device and its applicationsRICHTEK TECHNOLOGY CORP·Filed 2009·Granted Nov 23, 2010·0 cites·3 claims
- 4056US7838901B2Single-chip common-drain JFET device and its applicationsRICHTEK TECHNOLOGY CORP·Filed 2009·Granted Nov 23, 2010·0 cites·1 claims
- 4156US7768033B2Single-chip common-drain JFET device and its applicationsRICHTEK TECHNOLOGY CORP·Filed 2009·Granted Aug 3, 2010·0 cites·3 claims
- 4256US7759695B2Single-chip common-drain JFET device and its applicationsRICHTEK TECHNOLOGY CORP·Filed 2009·Granted Jul 20, 2010·0 cites·3 claims
- 4356US7678655B2Spacer layer etch method providing enhanced microelectronic device performanceTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Mar 16, 2010·1 cites·20 claims
- 4455US11777302B2Leakage current blocking circuit and leakage current blocking method for decoupling capacitorREALTEK SEMICONDUCTOR CORP·Filed 2021·Granted Oct 3, 2023·0 cites·8 claims
- 4553US8729630B1Double diffused metal oxide semiconductor device and manufacturing method thereofYANG CHING-YAO·Filed 2014·Granted May 20, 2014·0 cites·3 claims
- 4653US8728895B1Double diffused metal oxide semiconductor device and manufacturing method thereofYANG CHING-YAO·Filed 2014·Granted May 20, 2014·0 cites·3 claims
- 4753US8709900B1Double diffused metal oxide semiconductor device and manufacturing method thereofYANG CHING-YAO·Filed 2014·Granted Apr 29, 2014·0 cites·3 claims
- 4853US6828198B2System-on-chip (SOC) solutions with multiple devices by multiple poly gate trimming processTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Dec 7, 2004·4 cites·43 claims
- 4950US9245746B2Semiconductor composite film with heterojunction and manufacturing method thereofSU HUNG-DER·Filed 2013·Granted Jan 26, 2016·0 cites·5 claims
- 5048US9590049B2Semiconductor composite film with heterojunction and manufacturing method thereofSU HUNG-DER·Filed 2015·Granted Mar 7, 2017·0 cites·5 claims
Showing the top 50 of 73 patent records by PatentIndex Score.
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