Inventor · disambiguated record
Cheng-Yung Teng
Also filed as: TENG CHENG-YUNG
14 granted patents·5 pending applications·22 citations·filing 2005–2009
87Inventor score
Top patents by PatentIndex Score
19 records- 0167US7642801B2Circuit testing apparatus for testing a device under testPRINCETON TECHNOLOGY CORP·Filed 2007·Granted Jan 5, 2010·5 cites·8 claims
- 0263US7706999B2Circuit testing apparatusPRINCETON TECHNOLOGY CORP·Filed 2007·Granted Apr 27, 2010·5 cites·10 claims
- 0360US7855571B2Testing circuit board for preventing tested chip positions from being wrongly positionedPRINCETON TECHNOLOGY CORP·Filed 2008·Granted Dec 21, 2010·4 cites·10 claims
- 0453US7830163B2Testing circuit board for testing devices under testPRINCETON TECHNOLOGY CORP·Filed 2008·Granted Nov 9, 2010·2 cites·13 claims
- 0552US8269517B2Handler and method for testing the sameTENG CHENG-YUNG·Filed 2009·Granted Sep 18, 2012·2 cites·32 claims
- 0652US8148996B2Circuit testing apparatusTENG CHENG-YUNG·Filed 2007·Granted Apr 3, 2012·2 cites·11 claims
- 0750US2009140877A1Remote controllerPRINCETON TECHNOLOGY CORP·Filed 2008·Application pending·0 cites
- 0849US8037089B2Test systemPRINCETON TECHNOLOGY CORP·Filed 2008·Granted Oct 11, 2011·2 cites·14 claims
- 0948US8116475B2Audio generating moduleTENG CHENG-YUNG·Filed 2008·Granted Feb 14, 2012·0 cites·5 claims
- 1048US2010168899A1Product verification systemTENG CHENG-YUNG·Filed 2009·Application pending·0 cites
- 1138US8242769B2Method for measuring transconductanceTENG CHENG-YUNG·Filed 2009·Granted Aug 14, 2012·0 cites·16 claims
- 1237US8421474B2Circuit test apparatusTENG CHENG-YUNG·Filed 2008·Granted Apr 16, 2013·0 cites·7 claims
- 1337US8175824B2Circuit testing apparatusTENG CHENG-YUNG·Filed 2009·Granted May 8, 2012·0 cites·10 claims
- 1437US7908108B2Circuit testing apparatusPRINCETON TECHNOLOGY CORP·Filed 2008·Granted Mar 15, 2011·0 cites·15 claims
- 1536US8228384B2Circuit testing apparatusTENG CHENG-YUNG·Filed 2006·Granted Jul 24, 2012·0 cites·20 claims
- 1636US2009281744A1Testing devicesTENG CHENG-YUNG·Filed 2009·Application pending·0 cites
- 1735US7383477B2Interface circuit for using a low voltage logic tester to test a high voltage ICPRINCETON TECHNOLOGY CORP·Filed 2005·Granted Jun 3, 2008·0 cites·7 claims
- 1833US2007268037A1Circuit testing apparatusTENG CHENG-YUNG·Filed 2006·Application pending·0 cites
- 1933US2007024314A1Test system and single-chip tester capable of testing a plurality of chips simultaneouslyPRINCETON TECHNOLOGY CORP·Filed 2006·Application pending·0 cites
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