Inventor · disambiguated record
Darrell L. Miles
Also filed as: MILES DARRELL L
9 granted patents·2 pending applications·57 citations·filing 2000–2010
85Inventor score
Files withIBM11
Top patents by PatentIndex Score
11 records- 0180US6894522B2Specific site backside underlaying and micromasking method for electrical characterization of semiconductor devicesIBM·Filed 2003·Granted May 17, 2005·29 cites·15 claims
- 0277US7993504B2Backside unlayering of MOSFET devices for electrical and physical characterizationIBM·Filed 2008·Granted Aug 9, 2011·3 cites·20 claims
- 0376US7371689B2Backside unlayering of MOSFET devices for electrical and physical characterizationIBM·Filed 2005·Granted May 13, 2008·3 cites·14 claims
- 0473US6790125B2Backside integrated circuit die surface finishing technique and toolIBM·Filed 2000·Granted Sep 14, 2004·13 cites·3 claims
- 0550US7826045B2Angular spectrum tailoring in solid immersion microscopy for circuit analysisIBM·Filed 2008·Granted Nov 2, 2010·1 cites·14 claims
- 0649US7112983B2Apparatus and method for single die backside probing of semiconductor devicesIBM·Filed 2004·Granted Sep 26, 2006·6 cites·20 claims
- 0747US7961307B2Angular spectrum tailoring in solid immersion microscopy for circuit analysisIBM·Filed 2010·Granted Jun 14, 2011·0 cites·6 claims
- 0846US6852629B2Backside integrated circuit die surface finishing technique and toolIBM·Filed 2004·Granted Feb 8, 2005·2 cites·23 claims
- 0944US7015146B2Method of processing backside unlayering of MOSFET devices for electrical and physical characterization including a collimated ion plasmaIBM·Filed 2004·Granted Mar 21, 2006·0 cites·15 claims
- 1040US2008272474A1Apparatus for integrated circuit cooling during testing and image based analysisIBM·Filed 2008·Application pending·0 cites
- 1136US2007164426A1Apparatus and method for integrated circuit cooling during testing and image based analysisIBM·Filed 2006·Application pending·0 cites
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