Inventor · disambiguated record
Faguo Liang
Also filed as: LIANG FAGUO
5 granted patents·1 pending application·0 citations·filing 2018–2022
57Inventor score
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6 records- 0154US2023051442A1Method for Calibrating Crosstalk Errors in System for Measuring on-Wafer S Parameters and Electronic DeviceTHE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION·Filed 2022·Application pending·0 cites
- 0251US11385175B2Calibration method and terminal equipment of terahertz frequency band on-wafer S parameterTHE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION·Filed 2020·Granted Jul 12, 2022·0 cites·13 claims
- 0347US11733298B2Two-port on-wafer calibration piece circuit model and method for determining parametersTHE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION·Filed 2021·Granted Aug 22, 2023·0 cites·2 claims
- 0447US11340286B2On-wafer S-parameter calibration methodTHE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION·Filed 2018·Granted May 24, 2022·0 cites·9 claims
- 0545US11971451B2Method for determining parameters in on-wafer calibration piece modelTHE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION·Filed 2021·Granted Apr 30, 2024·0 cites·15 claims
- 0637US11275103B2Calibration method, system and device of on-wafer s parameter of vector network analyzerTHE 13TH RESEARCH INSTITUTE OF CHINA ELECTRONICS TECH GROUP CORPORATION·Filed 2020·Granted Mar 15, 2022·0 cites·13 claims
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