Inventor · disambiguated record
Takashi Sumigawa
Also filed as: SUMIGAWA TAKASHI
11 granted patents·3 pending applications·168 citations·filing 2005–2015
91Inventor score
Top patents by PatentIndex Score
14 records- 0196US7293466B2Bolt with function of measuring strainHITACHI LTD·Filed 2005·Granted Nov 13, 2007·43 cites·15 claims
- 0293US8056421B2Apparatus for measuring a mechanical quantitySUMIGAWA TAKASHI·Filed 2010·Granted Nov 15, 2011·25 cites·3 claims
- 0393US7707894B2Apparatus for measuring a mechanical quantityHITACHI LTD·Filed 2008·Granted May 4, 2010·23 cites·2 claims
- 0490US7252010B2Pressure sensor system with semiconductor chip and antenna memberHITACHI LTD·Filed 2005·Granted Aug 7, 2007·21 cites·9 claims
- 0585US7430920B2Apparatus for measuring a mechanical quantityHITACHI LTD·Filed 2005·Granted Oct 7, 2008·13 cites·2 claims
- 0684US7770462B2Apparatus for measuring a mechanical quantityHITACHI LTD·Filed 2008·Granted Aug 10, 2010·11 cites·8 claims
- 0783US7484422B2Mechanical-quantity measuring deviceHITACHI LTD·Filed 2006·Granted Feb 3, 2009·14 cites·9 claims
- 0871US7721610B2Rotating body dynamic quantity measuring device and systemHITACHI LTD·Filed 2008·Granted May 25, 2010·6 cites·2 claims
- 0969US7518202B2Mechanical quantity measuring apparatusHITACHI LTD·Filed 2006·Granted Apr 14, 2009·6 cites·15 claims
- 1067US7430921B2Apparatus for measuring a mechanical quantityHITACHI LTD·Filed 2007·Granted Oct 7, 2008·5 cites·8 claims
- 1155US8146443B2Rotating body dynamic quantity measuring device and systemOHTA HIROYUKI·Filed 2010·Granted Apr 3, 2012·1 cites·1 claims
- 1244US2016108514A1Method and apparatus for producing nanostructures, and substrate structure including nanostructuresUNIV KYOTO·Filed 2015·Application pending·0 cites
- 1340US2006043508A1Apparatus for measuring a mechanical quantityOHTA HIROYUKI·Filed 2005·Application pending·0 cites
- 1440US2006179958A1Rotating body dynamic quantity measuring device and systemOHTA HIROYUKI·Filed 2006·Application pending·0 cites
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