Inventor · disambiguated record
Yoshikazu Inada
Also filed as: INADA YOSHIKAZU
6 granted patents·3 pending applications·68 citations·filing 2002–2009
83Inventor score
Top patents by PatentIndex Score
9 records- 0189US7553334B2Defective product inspection apparatus, probe positioning method and probe moving methodHITACHI HIGH TECH CORP·Filed 2007·Granted Jun 30, 2009·9 cites·9 claims
- 0281US7129727B2Defect inspecting apparatusHITACHI HIGH TECH CORP·Filed 2005·Granted Oct 31, 2006·13 cites·20 claims
- 0380US7271385B2Inspection method and inspection apparatus using electron beamHITACHI HIGH TECH CORP·Filed 2005·Granted Sep 18, 2007·5 cites·5 claims
- 0479US7297945B2Defective product inspection apparatus, probe positioning method and probe moving methodHITACHI HIGH TECH CORP·Filed 2004·Granted Nov 20, 2007·18 cites·20 claims
- 0562US6995205B2Resin composition with high thermal conductivity and method of producing the sameOSAKA MUNICIPAL GOVERNMENT·Filed 2002·Granted Feb 7, 2006·22 cites·13 claims
- 0648US8074293B2Defective product inspection apparatus, probe positioning method and probe moving methodHAZAKI EIICHI·Filed 2009·Granted Dec 6, 2011·1 cites·8 claims
- 0745US2006247355A1Insulating and thermally conductive resin composition, molded article and method of producing the compositionKOSAKA WATARU·Filed 2006·Application pending·0 cites
- 0842US2005040331A1Inspection method and inspection apparatus using electron beamFiled 2004·Application pending·0 cites
- 0940US2004026633A1Inspection method and inspection apparatus using electron beamFiled 2003·Application pending·0 cites
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