Inventor · disambiguated record
Kiran Pangal
Also filed as: PANGAL KIRAN
84 granted patents·7 pending applications·564 citations·filing 1997–2021
99Inventor score
Top patents by PatentIndex Score
91 records- 0198US9857992B2Dynamic window to improve NAND enduranceINTEL CORP·Filed 2016·Granted Jan 2, 2018·34 cites·16 claims
- 0298US9250990B2Use of error correction pointers to handle errors in memoryINTEL CORP·Filed 2013·Granted Feb 2, 2016·63 cites·24 claims
- 0397US9824767B1Methods and apparatus to reduce threshold voltage driftINTEL CORP·Filed 2016·Granted Nov 21, 2017·25 cites·27 claims
- 0497US9652321B2Recovery algorithm in non-volatile memoryINTEL CORP·Filed 2014·Granted May 16, 2017·30 cites·21 claims
- 0594US9613691B2Apparatus and method for drift cancellation in a memoryINTEL CORP·Filed 2015·Granted Apr 4, 2017·20 cites·20 claims
- 0694US9601193B1Cross point memory controlINTEL CORP·Filed 2015·Granted Mar 21, 2017·12 cites·19 claims
- 0792US9437293B1Integrated setback read with reduced snapback disturbINTEL CORP·Filed 2015·Granted Sep 6, 2016·18 cites·21 claims
- 0891US11107523B1Multi-level cell (MLC) cross-point memoryINTEL CORP·Filed 2020·Granted Aug 31, 2021·3 cites·22 claims
- 0990US10032508B1Method and apparatus for multi-level setback read for three dimensional crosspoint memoryINTEL CORP·Filed 2016·Granted Jul 24, 2018·9 cites·20 claims
- 1090US9286975B2Mitigating read disturb in a cross-point memoryINTEL CORP·Filed 2014·Granted Mar 15, 2016·18 cites·12 claims
- 1190US8832530B2Techniques associated with a read and write window budget for a two level memory systemINTEL CORP·Filed 2012·Granted Sep 9, 2014·31 cites·24 claims
- 1289US10324793B2Reduced uncorrectable memory errorsINTEL CORP·Filed 2018·Granted Jun 18, 2019·4 cites·22 claims
- 1389US9384831B2Cross-point memory single-selection write techniqueINTEL CORP·Filed 2014·Granted Jul 5, 2016·8 cites·19 claims
- 1489US9164836B2Cycling endurance extending for memory cells of a non-volatile memory arrayGUO XIN·Filed 2011·Granted Oct 20, 2015·13 cites·27 claims
- 1589US9165647B1Multistage memory cell readGULIANI SANDEEP·Filed 2014·Granted Oct 20, 2015·14 cites·20 claims
- 1689US9136873B2Reduced uncorrectable memory errorsINTEL CORP·Filed 2013·Granted Sep 15, 2015·8 cites·25 claims
- 1788US9653127B1Methods and apparatuses for modulating threshold voltages of memory cellsMICRON TECHNOLOGY INC·Filed 2015·Granted May 16, 2017·7 cites·22 claims
- 1888US9330784B2Dynamic window to improve NAND endurancePANGAL KIRAN·Filed 2011·Granted May 3, 2016·12 cites·25 claims
- 1988US9202547B2Managing disturbance induced errorsINTEL CORP·Filed 2013·Granted Dec 1, 2015·8 cites·18 claims
- 2088US9047187B2Defect management in memory systemsGUO XIN·Filed 2012·Granted Jun 2, 2015·12 cites·34 claims
- 2186US9685204B2Cross-point memory single-selection write techniqueINTEL CORP·Filed 2016·Granted Jun 20, 2017·5 cites·26 claims
- 2286US9231202B2Thermal-disturb mitigation in dual-deck cross-point memoriesINTEL CORP·Filed 2013·Granted Jan 5, 2016·5 cites·24 claims
- 2386US6300756B2Micro-mechanical probes for charge sensingUNIV PRINCETON·Filed 1997·Granted Oct 9, 2001·53 cites·21 claims
- 2485US10331345B2Method and apparatus for reducing silent data errors in non-volatile memory systemsINTEL CORP·Filed 2017·Granted Jun 25, 2019·4 cites·24 claims
- 2585US9589634B1Techniques to mitigate bias drift for a memory deviceINTEL CORP·Filed 2016·Granted Mar 7, 2017·6 cites·22 claims
- 2685US9478286B1Transient current-protected threshold switching devices systems and methodsINTEL CORP·Filed 2015·Granted Oct 25, 2016·5 cites·23 claims
- 2784US11170853B2Modified write voltage for memory devicesMICRON TECHNOLOGY INC·Filed 2020·Granted Nov 9, 2021·2 cites·25 claims
- 2883US9619324B2Error correction in non—volatile memoryINTEL CORP·Filed 2013·Granted Apr 11, 2017·6 cites·25 claims
- 2983US9384801B2Threshold voltage expansionINTEL CORP·Filed 2014·Granted Jul 5, 2016·8 cites·22 claims
- 3083US9208022B2Techniques for adaptive moving read references for memory cell read error recoveryINTEL CORP·Filed 2014·Granted Dec 8, 2015·7 cites·23 claims
- 3180US10056136B2Cross-point memory single-selection write techniqueINTEL CORP·Filed 2017·Granted Aug 21, 2018·3 cites·24 claims
- 3279US9852789B2Transient current-protected threshold switching devices systems and methodsINTEL CORP·Filed 2016·Granted Dec 26, 2017·3 cites·22 claims
- 3379US9368205B2Set and reset operation in phase change memory and associated techniques and configurationsINTEL CORP·Filed 2013·Granted Jun 14, 2016·6 cites·12 claims
- 3479US8792283B2Extended select gate lifetimeWAKCHAURE YOGESH B·Filed 2012·Granted Jul 29, 2014·5 cites·13 claims
- 3578US11145366B1Techniques to mitigate error during a read operation to a memory arrayINTEL CORP·Filed 2020·Granted Oct 12, 2021·1 cites·23 claims
- 3676US9792986B2Phase change memory currentINTEL CORP·Filed 2015·Granted Oct 17, 2017·4 cites·18 claims
- 3776US8959407B2Scaling factors for hard decision reads of codewords distributed across dieINTEL CORP·Filed 2012·Granted Feb 17, 2015·5 cites·26 claims
- 3875US10073731B2Error correction in memoryINTEL CORP·Filed 2013·Granted Sep 11, 2018·3 cites·15 claims
- 3974US9030885B2Extended select gate lifetimeINTEL CORP·Filed 2014·Granted May 12, 2015·3 cites·15 claims
- 4073US9934088B2Reduced uncorrectable memory errorsINTEL CORP·Filed 2015·Granted Apr 3, 2018·2 cites·30 claims
- 4173US9613698B2Set and reset operation in phase change memory and associated techniques and configurationsINTEL CORP·Filed 2016·Granted Apr 4, 2017·3 cites·15 claims
- 4273US9543005B2Multistage memory cell readINTEL CORP·Filed 2015·Granted Jan 10, 2017·3 cites·22 claims
- 4373US6949801B2Dual trench isolation using single critical lithographic patterningINTEL CORP·Filed 2003·Granted Sep 27, 2005·16 cites·24 claims
- 4472US9905280B2Methods and apparatuses for modulating threshold voltages of memory cellsMICRON TECHNOLOGY INC·Filed 2017·Granted Feb 27, 2018·2 cites·20 claims
- 4572US9892785B2Multistage set procedure for phase change memoryINTEL CORP·Filed 2017·Granted Feb 13, 2018·2 cites·20 claims
- 4672US9698830B2Single-bit first error correctionINTEL CORP·Filed 2013·Granted Jul 4, 2017·4 cites·13 claims
- 4771US9792963B2Managing disturbance induced errorsINTEL CORP·Filed 2015·Granted Oct 17, 2017·2 cites·22 claims
- 4870US10026460B2Techniques to mitigate bias drift for a memory deviceINTEL CORP·Filed 2017·Granted Jul 17, 2018·2 cites·15 claims
- 4970US9583187B2Multistage set procedure for phase change memoryINTEL CORP·Filed 2015·Granted Feb 28, 2017·2 cites·20 claims
- 5070US6849518B2Dual trench isolation using single critical lithographic patterningINTEL CORP·Filed 2002·Granted Feb 1, 2005·15 cites·32 claims
Showing the top 50 of 91 patent records by PatentIndex Score.
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