Inventor · disambiguated record
William A. Hagerup
Also filed as: HAGERUP WILLIAM A
24 granted patents·5 pending applications·368 citations·filing 2000–2020
96Inventor score
Top patents by PatentIndex Score
29 records- 0194US6477054B1Low temperature co-fired ceramic substrate structure having a capacitor and thermally conductive viaTEKTRONIX INC·Filed 2000·Granted Nov 5, 2002·99 cites·19 claims
- 0292US10041975B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2015·Granted Aug 7, 2018·4 cites·3 claims
- 0392US9194888B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2012·Granted Nov 24, 2015·7 cites·7 claims
- 0492US7251265B2Micro-cavity laser having increased sensitivityTEKTRONIX INC·Filed 2005·Granted Jul 31, 2007·19 cites·7 claims
- 0591US7460983B2Signal analysis system and calibration methodTEKTRONIX INC·Filed 2006·Granted Dec 2, 2008·30 cites·21 claims
- 0690US10168356B2Test and measurement probe with adjustable test point contactTEKTRONIX INC·Filed 2015·Granted Jan 1, 2019·4 cites·13 claims
- 0790US7049843B2Signal acquisition probing system using a micro-cavity laser capable of sensing DC voltagesTEKTRONIX INC·Filed 2005·Granted May 23, 2006·15 cites·13 claims
- 0888US10241133B2Probe tip and probe assemblyTEKTRONIX INC·Filed 2017·Granted Mar 26, 2019·8 cites·16 claims
- 0988US9810715B2High impedance compliant probe tipTEKTRONIX INC·Filed 2014·Granted Nov 7, 2017·9 cites·17 claims
- 1088US7056134B2Attachable/detachable probing tip system for a measurement probing systemTEKTRONIX INC·Filed 2004·Granted Jun 6, 2006·39 cites·21 claims
- 1188US6967473B1Attachable/detachable variable spacing probing tip systemTEKTRONIX INC·Filed 2004·Granted Nov 22, 2005·40 cites·18 claims
- 1287US6373348B1High speed differential attenuator using a low temperature co-fired ceramic substrateTEKTRONIX INC·Filed 2000·Granted Apr 16, 2002·51 cites·23 claims
- 1382US9772391B2Method for probe equalizationTEKTRONIX INC·Filed 2014·Granted Sep 26, 2017·4 cites·15 claims
- 1480US7256575B2Wide bandwidth attenuator input circuit for a measurement probeTEKTRONIX INC·Filed 2005·Granted Aug 14, 2007·9 cites·5 claims
- 1579US7310455B2Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavityTEKTRONIX INC·Filed 2005·Granted Dec 18, 2007·5 cites·20 claims
- 1675US7402991B2Wide bandwidth attenuator input circuit for a measurement probeTEKTRONIX INC·Filed 2007·Granted Jul 22, 2008·6 cites·7 claims
- 1774US11454651B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2020·Granted Sep 27, 2022·0 cites·10 claims
- 1872US7994801B2Calibrated S-parameter measurements of a high impedance probeTEKTRONIX INC·Filed 2008·Granted Aug 9, 2011·7 cites·7 claims
- 1967US7424177B2Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavityTEKTRONIX INC·Filed 2007·Granted Sep 9, 2008·2 cites·25 claims
- 2066US11249111B2Automatic probe ground connection checking techniquesTEKTRONIX INC·Filed 2018·Granted Feb 15, 2022·0 cites·8 claims
- 2158US7221813B2Signal acquisition probing and voltage measurement systems using an electro-optical cavityTEKTRONIX INC·Filed 2005·Granted May 22, 2007·3 cites·45 claims
- 2256US6659812B2Surface mount probe point socket and systemTEKTRONIX INC·Filed 2002·Granted Dec 9, 2003·7 cites·16 claims
- 2348US2005185768A1Calibration method and apparatusFiled 2004·Application pending·0 cites
- 2447US2007041512A1Calibration method and apparatusPICKERD JOHN J·Filed 2006·Application pending·0 cites
- 2545US10119992B2High impedance compliant probe tipTEKTRONIX INC·Filed 2015·Granted Nov 6, 2018·0 cites·17 claims
- 2641US2005201684A1Conductive electrode structure for an electro-optic materialFiled 2005·Application pending·0 cites
- 2741US2005185769A1Calibration method and apparatusFiled 2005·Application pending·0 cites
- 2841US2005201685A1Optical cavity having increased sensitivityFiled 2005·Application pending·0 cites
- 2937US7187187B2Signal acquisition probing system using a micro-cavity laserTEKTRONIX INC·Filed 2005·Granted Mar 6, 2007·0 cites·13 claims
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