Inventor · disambiguated record
Todd Burdine
Also filed as: BURDINE TODD M · BURDINE TODD MICHAEL
9 granted patents·127 citations·filing 2003–2008
89Inventor score
Files withIBM9
Top patents by PatentIndex Score
9 records- 0182US7225374B2ABIST-assisted detection of scan chain defectsIBM·Filed 2003·Granted May 29, 2007·29 cites·20 claims
- 0279US7234090B2Method and apparatus for selective scan chain diagnosticsIBM·Filed 2004·Granted Jun 19, 2007·25 cites·30 claims
- 0377US7392449B2Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chainIBM·Filed 2007·Granted Jun 24, 2008·7 cites·11 claims
- 0477US7107502B2Diagnostic method for detection of multiple defects in a Level Sensitive Scan Design (LSSD)IBM·Filed 2004·Granted Sep 12, 2006·22 cites·22 claims
- 0572US7089474B2Method and system for providing interactive testing of integrated circuitsIBM·Filed 2004·Granted Aug 8, 2006·17 cites·20 claims
- 0670US7395470B2Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chainIBM·Filed 2005·Granted Jul 1, 2008·4 cites·9 claims
- 0767US7395469B2Method for implementing deterministic based broken scan chain diagnosticsIBM·Filed 2004·Granted Jul 1, 2008·12 cites·11 claims
- 0863US7340496B2System and method for determining the Nth state of linear feedback shift registersIBM·Filed 2003·Granted Mar 4, 2008·9 cites·9 claims
- 0956US7475308B2implementing deterministic based broken scan chain diagnosticsIBM·Filed 2008·Granted Jan 6, 2009·2 cites·7 claims
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