Inventor · disambiguated record
Yuan-Yao Chang
Also filed as: CHANG YUAN-YAO
12 granted patents·7 pending applications·9 citations·filing 2010–2025
84Inventor score
Top patents by PatentIndex Score
19 records- 0182US10510623B2Overlay error and process window metrologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 17, 2019·3 cites·20 claims
- 0281US2025329678A1Chip structure with conductive pillarTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0379US12159809B2System and method for measuring device inside through-silicon via surroundingsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Dec 3, 2024·0 cites·20 claims
- 0477US11927628B2Benchmark circuit on a semiconductor wafer and method for operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Mar 12, 2024·1 cites·20 claims
- 0576US2024395640A1System and method for measuring device inside through-silicon via surroundingsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0675US12417992B2Chip structure with conductive pillar and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 16, 2025·0 cites·20 claims
- 0770US11955392B2System and method for measuring device inside through-silicon via surroundingsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Apr 9, 2024·0 cites·20 claims
- 0870US2024288489A1Test circuit and method for operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0969US11688708B2Chip structure and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 27, 2023·0 cites·20 claims
- 1069US10605855B2Method, test line and system for detecting semiconductor wafer defectsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Mar 31, 2020·2 cites·20 claims
- 1164US12007431B2Test circuit and method for operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 11, 2024·0 cites·20 claims
- 1263US2024175920A1Benchmark circuit on a semiconductor wafer and method for operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1359US9995770B2Multidirectional semiconductor arrangement testingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jun 12, 2018·1 cites·20 claims
- 1458US10879135B2Overlay error and process window metrologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 29, 2020·0 cites·20 claims
- 1556US8779796B2Method and apparatus for device parameter measurementLUO TSENG CHIN·Filed 2010·Granted Jul 15, 2014·2 cites·19 claims
- 1653US2025314692A1Testing apparatus and method for operating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1749US2024107325A1Controller-based channel selection for access pointsARRIS ENTPR LLC·Filed 2023·Application pending·0 cites
- 1848US11754614B2Semiconductor device and analyzing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Sep 12, 2023·0 cites·20 claims
- 1946US2023198805A1Assignment of vxlan network identifiers and data planesARRIS ENTPR LLC·Filed 2022·Application pending·0 cites
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