Inventor · disambiguated record
Hsiao-Wen Chung
Also filed as: CHUNG HSIAO-WEN
11 granted patents·4 pending applications·12 citations·filing 2008–2025
82Inventor score
Top patents by PatentIndex Score
15 records- 0181US2025329678A1Chip structure with conductive pillarTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0279US2025300028A1Dummy Patterns in Redundant Region of Double Seal RingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0376US12341071B2Dummy patterns in redundant region of double seal ringTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jun 24, 2025·0 cites·19 claims
- 0475US12417992B2Chip structure with conductive pillar and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 16, 2025·0 cites·20 claims
- 0572US2025329536A1Semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0671US11229375B2Method for determining ischemic status or assessing stroke onset time of a brain regionUNIV TAIPEI MEDICAL·Filed 2017·Granted Jan 25, 2022·2 cites·15 claims
- 0769US11728229B2Dummy patterns in redundant region of double seal ringTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Aug 15, 2023·0 cites·20 claims
- 0869US11688708B2Chip structure and method for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 27, 2023·0 cites·20 claims
- 0969US2025300099A1Mandrel Fin Design For Double Seal RingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1065US12412746B2Semiconductor device and method for fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 9, 2025·0 cites·20 claims
- 1164US11826136B2Method for determining ischemic status or assessing stroke onset time of a brain regionUNIV TAIPEI MEDICAL·Filed 2021·Granted Nov 28, 2023·0 cites·8 claims
- 1263US12341113B2Mandrel fin design for double seal ringTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jun 24, 2025·0 cites·20 claims
- 1362US8229544B2Detecting temperature and protein denaturation during thermal therapyTSENG WEN-YIH ISAAC·Filed 2008·Granted Jul 24, 2012·10 cites·26 claims
- 1458US11855010B2Semiconductor structure and method for forming features in redundant region of double seal ringTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Dec 26, 2023·0 cites·20 claims
- 1536US8208714B2Formation of prescribed pattern on wafer for use in SEM defect offsetLIU MU-CHIEH·Filed 2009·Granted Jun 26, 2012·0 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →