Inventor · disambiguated record
Jun Matsuhashi
Also filed as: MATSUHASHI JUN
8 granted patents·20 citations·filing 2010–2018
80Inventor score
Top patents by PatentIndex Score
8 records- 0186US9905482B2Method of manufacturing a semiconductor device and inspecting an electrical characteristic thereof using test socket terminalsRENESAS ELECTRONICS CORP·Filed 2017·Granted Feb 27, 2018·5 cites·12 claims
- 0285US8603840B2Manufacturing method of semiconductor deviceMATSUHASHI JUN·Filed 2012·Granted Dec 10, 2013·11 cites·12 claims
- 0371US10551432B2Method of manufacturing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2018·Granted Feb 4, 2020·1 cites·15 claims
- 0465US9945903B2Semiconductor device manufacturing methodRENESAS ELECTRONICS CORP·Filed 2016·Granted Apr 17, 2018·1 cites·19 claims
- 0561US9761501B2Method of manufacturing a semiconductor device and inspecting an electrical characteristic thereof using socket terminalsRENESAS ELECTRONICS CORP·Filed 2013·Granted Sep 12, 2017·1 cites·15 claims
- 0660US9515000B2Method for manufacturing semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Dec 6, 2016·1 cites·19 claims
- 0741US10109568B2Semiconductor device manufacturing method and semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2017·Granted Oct 23, 2018·0 cites·16 claims
- 0834US8404497B2Semiconductor device and method of manufacturing the sameMARUYAMA KAZUYA·Filed 2010·Granted Mar 26, 2013·0 cites·5 claims
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