Inventor · disambiguated record
Yuriy Platonov
Also filed as: PLATONOV YURIY · PLATONOV YURIY Y
10 granted patents·1 pending application·175 citations·filing 2001–2023
90Inventor score
Top patents by PatentIndex Score
11 records- 0187US8249220B2Multiconfiguration X-ray optical systemVERMAN BORIS·Filed 2009·Granted Aug 21, 2012·28 cites·7 claims
- 0287US7848483B2Magnesium silicide-based multilayer x-ray fluorescence analyzersRIGAKU INNOVATIVE TECHNOLOGIES·Filed 2008·Granted Dec 7, 2010·30 cites·26 claims
- 0385US6763086B2Method and apparatus for detecting boron in x-ray fluorescence spectroscopyOSMIC INC·Filed 2002·Granted Jul 13, 2004·37 cites·32 claims
- 0483US6809864B2Multi-layer structure with variable bandpass for monochromatization and spectroscopyOSMIC INC·Filed 2002·Granted Oct 26, 2004·27 cites·17 claims
- 0582US10436723B2X-ray diffractometer with multilayer reflection-type monochromatorRIGAKU DENKI CO LTD·Filed 2015·Granted Oct 8, 2019·2 cites·12 claims
- 0675US6804324B2X-ray phase contrast imaging using a fabry-perot interferometer conceptOSMO INC·Filed 2001·Granted Oct 12, 2004·25 cites·30 claims
- 0775US6643353B2Protective layer for multilayers exposed to x-raysOSMIC INC·Filed 2002·Granted Nov 4, 2003·18 cites·45 claims
- 0863US6510200B1Multi-layer structure with variable bandpass for monochromatization and spectroscopyOSMIC INC·Filed 2001·Granted Jan 21, 2003·8 cites·27 claims
- 0958US11885753B2Imaging type X-ray microscopeRIGAKU DENKI CO LTD·Filed 2021·Granted Jan 30, 2024·0 cites·5 claims
- 1058US11867646B2Total reflection x-ray fluorescence spectrometerRIGAKU DENKI CO LTD·Filed 2021·Granted Jan 9, 2024·0 cites·8 claims
- 1158US2025251355A1Semiconductor inspection apparatus, semiconductor inspection system and semiconductor inspection methodRIGAKU DENKI CO LTD·Filed 2023·Application pending·0 cites
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